In:
Journal of Applied Physics, AIP Publishing, Vol. 87, No. 9 ( 2000-05-01), p. 7067-7069
Abstract:
The results are presented of a study into the magnetic properties of deep submicron elliptical nanomagnets. Small arrays of 2:1 aspect ratio ellipses of major axis size 500–100 nm and of thickness 5–10 nm have been fabricated out of supermalloy. A high sensitivity magneto-optical method has then been used to measure the hysteresis loops of each array. From these measurements the effective shape anisotropy in the elongated elements can be accurately determined. The measured shape anisotropy is found to be significantly smaller (approximately 50%) than that which would be expected from standard magnetostatic calculations. It is shown experimentally and theoretically that lateral interface (i.e., edge) roughness of only a few nanometers, which is present in any real nanomagnet, leads to the appearance of a powerful anisotropy of magnetostatic origin which competes strongly with the in-plane shape anisotropy, thus accounting for the anomalously low experimental values. The significance of this for data stability in magnetic random access memory is discussed.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
2000
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
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