In:
Review of Scientific Instruments, AIP Publishing, Vol. 72, No. 11 ( 2001-11-01), p. 4218-4222
Abstract:
The double-modulation reflectance technique has proven to be a powerful characterization tool of semiconductors applied in high-background–light-interference systems. In this article, we present a novel and inexpensive electronic-circuit design for implementing the double-modulation measurements using only one lock-in amplifier. The electronic design is fabricated in an accessory hardware of modulation spectroscopy which can easily select the double- or single-modulation mode via a manual switch. Detailed design diagrams of the electronic hardware are described. Measurements of some representative samples of semiconductors and actual device structures are carried out. Experimental results demonstrated the well-behaved performance of this design.
Type of Medium:
Online Resource
ISSN:
0034-6748
,
1089-7623
Language:
English
Publisher:
AIP Publishing
Publication Date:
2001
detail.hit.zdb_id:
209865-9
detail.hit.zdb_id:
1472905-2
SSG:
11
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