GLORIA

GEOMAR Library Ocean Research Information Access

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • American Institute of Physics (AIP)  (2)
  • 2000-2004  (2)
  • 1970-1974
  • 1880-1889
Document type
Publisher
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    Role of orbital polarization in calculations of the magnetic anisotropy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5875-5877 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic anisotropy is a difficult topic to describe by electronic structure theory. The results of ab initio calculations for iron and nickel are disappointing, especially since these calculations require high numerical precision and are very time consuming. For iron the value of the energy is too small by a factor of 3, while for nickel the sign is wrong and the value is too small by a factor of 5. The local density approximation can be improved by adding corrections that mimic the inclusion of Hund's second rule. This is equivalent to increasing the effective spin–orbit parameter. For iron a small increase in the effective spin–orbit parameter is sufficient to reconcile theory and experiment. For nickel, this is not possible. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372552
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    In situ x-ray microscopic observation of the electromigration in passivated Cu interconnects (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1936-1938 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray imaging of electromigration in a passivated Cu interconnect was performed with 100-nm spatial resolution. A time sequence of 200 images, recorded with the European Synchrotron Radiation Facility x-ray microscope in 2.2 h at 4 keV photon energy, visualizes the mass flow of Cu at current densities up to 2×107 A/cm2. Due to the high penetration power through matter and the element specific image contrast, x-ray microscopy is a unique tool for time-resolved, quantitative mass transport measurements in interconnects. Model calculations predict that failures in operating microprocessors are detectable with 30 nm resolution by nanotomography. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1356446
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...