In:
Applied Physics Letters, AIP Publishing, Vol. 93, No. 12 ( 2008-09-22)
Abstract:
Nonpolar (112¯0) ZnO films were grown on LaAlO3 (001) single crystal substrates at temperature from 300 to 750 °C by pulsed laser deposition method. The films were examined using x-ray diffraction, reflection high energy electron diffraction, and photoluminescence measurements for the crystallinity. The surface morphology of ZnO films from atomic force microscopy exhibits L-shaped domains. Cross-sectional transmission electron microscopy with selected area diffraction reveals two types of a-plane ZnO domains perpendicular to each other with in-plane orientation relationships of [0001]ZnO∥[11¯0] LAO and [11¯00]ZnO∥[11¯0] LAO.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2008
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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