In:
MRS Proceedings, Springer Science and Business Media LLC, Vol. 907 ( 2005)
Abstract:
Electromagnetic fields presents in some real materials have been observed using electron holography and a simple method named the Shadow Image Distortion (SID) method which we have developed. The in-situ electron holography observation of the electric field surrounding a ceramic particle showed the rapid degradation of dielectric properties of the particle at an elevated temperature. The cross sectional view of mean electrostatic potential distributions in a silicon device has been observed. In-situ electron holography and SID observations showed the electrostatic potential distribution across a reverse biased p-n junction in a compound semiconductor. The SID method using a dedicated tool allowed single-step imaging of 2D maps of electromagnetic field.
Type of Medium:
Online Resource
ISSN:
0272-9172
,
1946-4274
DOI:
10.1557/PROC-0907-MM04-02
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
2005
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