In:
Microscopy Today, Oxford University Press (OUP), Vol. 15, No. 5 ( 2007-09-01), p. 16-21
Abstract:
Most of the specimens for high-resolution electron microscopy have amorphous surface layers due to contamination during observation and/or damaged surface layers during specimen preparation. Moreover, many specimens are radiation sensitive, and a part of the specimen easily becomes amorphous during the observation. These amorphous materials make clear observation of crystal structure difficult. A periodic structure may be extracted by simply using a periodic mask in Fourier space. However, this kind of mask often introduces a periodic feature in addition to the crystal structure. To reduce such artifacts a Wiener filter or an average background subtraction filter has been discussed. However, these filters do not work for non-ideal crystals, such as cylindrical crystals and nano-crystals, where a translational periodicity is limited to the order of nano-meter. In this report we improve these filters by introducing new ways to estimate a contribution from the amorphous materials.
Type of Medium:
Online Resource
ISSN:
2150-3583
,
1551-9295
DOI:
10.1017/S1551929500061186
Language:
English
Publisher:
Oxford University Press (OUP)
Publication Date:
2007
detail.hit.zdb_id:
2139756-9
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