Publication Date:
2012-06-16
Description:
Author(s): P. Paruch, A. B. Kolton, X. Hong, C. H. Ahn, and T. Giamarchi Using piezoresponse force microscopy on epitaxial ferroelectric thin films, we have measured the evolution of domain wall roughening as a result of heat-quench cycles up to 735 ∘ C, with the effective roughness exponent ζ changing from 0.25 to 0.5. We discuss two possible mechanisms for the observed ... [Phys. Rev. B 85, 214115] Published Fri Jun 15, 2012
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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