In:
Communications in Physics, Publishing House for Science and Technology, Vietnam Academy of Science and Technology (Publications), Vol. 24, No. 3S1 ( 2014-11-07), p. 71-79
Kurzfassung:
We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
Materialart:
Online-Ressource
ISSN:
2815-5947
,
0868-3166
DOI:
10.15625/0868-3166-24-3S1
DOI:
10.15625/0868-3166/24/3S1/5222
Sprache:
Unbekannt
Verlag:
Publishing House for Science and Technology, Vietnam Academy of Science and Technology (Publications)
Publikationsdatum:
2014
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