In:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 28, No. 3 ( 2010-05-01), p. C4D1-C4D4
Abstract:
In this article, the authors present the simultaneous noncontact atomic force microscopy and scanning tunneling microscopy measurement of the Ge(111)-c(2×8) surface using PtIr-coated Si cantilevers at room temperature. In both frequency shift and time-averaged tunneling current images at constant-height mode, each atom was clearly resolved. The image contrasts differ because the time-averaged tunneling current image is more directly coupled with local density of states than the frequency shift image. They demonstrate the measurement of the site-specific scanning tunneling spectroscopy (STS) spectra, which are in good agreement with typical STS measurements. Moreover, they demonstrate the simultaneous measurements of site-specific frequency shift and tunneling current as a function of tip-sample distance curves. On the Ge(111)-c(2×8) surface, tunneling current dropped at the near-contact region where a strong tip-sample interaction force is observed.
Type of Medium:
Online Resource
ISSN:
2166-2746
,
2166-2754
Language:
English
Publisher:
American Vacuum Society
Publication Date:
2010
detail.hit.zdb_id:
3117331-7
detail.hit.zdb_id:
1475429-0
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