In:
Applied Physics Letters, AIP Publishing, Vol. 97, No. 19 ( 2010-11-08)
Abstract:
Spin noise spectroscopy (SNS) is the perfect tool to investigate electron spin dynamics in semiconductors at thermal equilibrium. We simulate SNS measurements which utilize real-time fast Fourier transformation instead of an ordinary spectrum analyzer and show that ultrafast digitizers with low resolution enable surprisingly sensitive, high bandwidth SNS in the presence of strong optical background shot noise. The simulations reveal that optimized input load at the digitizer is crucial for efficient spin noise detection while the resolution of the digitizer, i.e., the bit depth, influences the sensitivity rather weakly.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2010
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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