GLORIA

GEOMAR Library Ocean Research Information Access

X

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 11
    Online Resource
    Online Resource
    Raman and Electrical Analysis of Iodine-Doped Amorphous Carbon Thin Films
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 281-286
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 281-286
    Abstract: Iodine doped amorphous carbon (a-C: I) thin films were prepared by using Thermal Chemical Vapor Deposition (CVD) with deposition temperature ranging from 5000C to 7000C. The physical and electrical properties of deposited a-C:I thin films were characterized by Raman spectroscope and Solar Simulator system. The presence of 2 peaks known as Raman D peaks and Raman G peaks ensure the amorphous structure of carbon (C). As deposition temperature increase, the ID/IG ratio shows difference value, which indicates the effects of the temperature towards the a-C: I structures. An ohmic graph was obtained for the IV measurement, and the conductivity varies from 10-4 to 101 Scm-1. The photoresponse was also determined for all samples. As a reference, an undoped a-C thin film was prepared to differentiate the characteristic between a-C and a-C: I.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.667
    DOI: 10.4028/www.scientific.net/AMR.667.281
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 12
    Online Resource
    Online Resource
    Synthesis and Characterization of Carbon Nanotubes from Palm Oil by Aerosol-Assisted CVD
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 218-223
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 218-223
    Abstract: This paper will report on the synthesis of bundles of aligned single wall carbon nanotubes (SWCNTs) and multiwall carbon nanotubes (MWCNTs) from palm oil precursor and ferrocene as catalyst source by two stage aerosol-assisted CVD system at various deposition temperature ranging from 700-900oC. Palm oil was pyrolised into the furnace which contained the catalyst source producing black substances at the wall of the reaction furnace which were then collected to be characterized. Field emission scanning electron microscopy equipped with energy dispersive X-ray was used to obtain weight percentage, identification of samples and image of CNTs which showed different structures and diameters of CNTs relative to the deposition temperature of furnace. Raman Spectroscopy was used to further study the quality and identification of samples and finally X-ray powder diffraction was used to determine the crystalinity of samples. Individual micrograph of MWNTs at optimized deposition temperature was also obtained from the high resolution transmission electron microscopy.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.667
    DOI: 10.4028/www.scientific.net/AMR.667.218
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 13
    Online Resource
    Online Resource
    Transmittance Enhanced Properties of Novel Encapsulated ITO/Arc-TiO〈sub〉2〈/sub〉 Antireflective TCO Substrate Prepared by RF Magnetron Sputtering
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 573-582
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 573-582
    Abstract: In this work, a thermally stable multilayered transparent conducting oxide (TCO) utilizing TiO2 antireflection thin film (arc-TiO2) encapsulated under indium tin oxide (ITO) glass has been prepared by RF magnetron sputtering. The novel tri-functional conducting substrate with blocking layer capabilities has been designed via step-down interference coating structure of double layer antireflection coating (DLAR). The mixed-oriented type between the strongest ITO peak at (222) and a weak TiO2 peaks at (101) orientations have been observed under XRD analysis. The antireflection properties of double-layer ITO/arc-TiO2 is evidence with the existence of two maximum peaks around 410 nm and 750 nm. While, the corresponding reduction in reflectance of about 8% and 2% compared to bare ITO was achieved. The ITO/arc-TiO2 blocking layers conserves the low resistivity of ITO at 2.05 x 10-4 Ω cm, even after oxidizing during air annealing process above 400 °C. These results demonstrate that the multilayered ITO/arc-TiO2 with tailored refractive index by means of annealing treatment is a promising approach to realize a substrate which (a): electrically and thermally stable against processing temperature, (b): sustains the higher transmittance of the substrate even there is increase in total substrate thickness and (c): prevents electron recombination process occurring at the interface between the redox electrolytes and the TCO surface. The stable properties are found to be beneficial for use as TCOs in DSSCs.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.667
    DOI: 10.4028/www.scientific.net/AMR.667.573
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 14
    Online Resource
    Online Resource
    Surface Morphology of Seeded Nanostructured ZnO on Silicon by Sol-Gel Technique
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 265-271
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 265-271
    Abstract: Nanostructured ZnO as a seeded was prepared by sol-gel technique on p-type silicon in various low molarities. Zinc acetate, Diethanolamine (DEA), and isopropyl were use as starting material, stabilizer, and solvent respectively. Atomic Force Microscopy (AFM) analysis shows smooth surface and uniform layer were produced in low molarities of precursor. The surface morphology of nanostructured ZnO was analyzed by Field Emission Scanning Electron Microscopic (FESEM). It is found that the nanostructured ZnO were successfully deposited on the silicon substrate with size ~10 nm to ~35 nm. Photoluminescence spectroscopy was employed to study the band gap in room temperature. It shows that very low intensity of PL in 0.05m and 0.1 m. PL intensity become more obvious starting from 0.15 m of precursor concentration.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.667
    DOI: 10.4028/www.scientific.net/AMR.667.265
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 15
    Online Resource
    Online Resource
    Structural and Optical Properties of Nanohybrid PMMA/TiO〈sub〉2〈/sub〉
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 63-67
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 63-67
    Abstract: Preparation of nanohybrid PMMA/TiO2 hybrid was reported by using mixture sol-gel spin coating method. This studied involve modification band gap of TiO2 at different molar concentration of TTiB precursor. AFM image show TiO2 particles encapsulated with PMMA matrix. From UV-Vis spectroscope, we have found as increase of TTiB precursor molar concentration, optical band gap is 3.34 eV, increase in UV-range from 3.25 eV. This study suggested for improvement of optical band gap TiO2 coated glass.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.667
    DOI: 10.4028/www.scientific.net/AMR.667.63
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 16
    Online Resource
    Online Resource
    Dispersion of TiO〈sub〉2〈/sub〉 Nanopowder in the PMMA Matrix Prepared by Sonication-Solution Casting Method
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 115-121
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 115-121
    Abstract: This paper discussed on the structural properties of the PMMA/TiO2 nanocomposite films prepared using sonication-solution casting method. The structural properties of the nanocomposite films were compared by mixing the self-prepared TiO2 (~12 nm) and the commercially available TiO2 (25 nm) in the PMMA. The well dispersion of self-prepared TiO2 nanopowder was observed in the FESEM micrograph. XRD results show that the self-prepared TiO2 nanopowder decrease the crystallinity of the nanocomposite. Further, FTIR reveals that the interaction between the PMMA and TiO2 nanoparticles were detected.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.667
    DOI: 10.4028/www.scientific.net/AMR.667.115
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 17
    Online Resource
    Online Resource
    Dielectric Properties of PVDF-TrFE/PMMA: TiO〈sub〉2〈/sub〉 Multilayer Dielectric Thin Films
    Trans Tech Publications, Ltd. ; 2012
    In:  Advanced Materials Research Vol. 576 ( 2012-10), p. 582-585
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 576 ( 2012-10), p. 582-585
    Abstract: This paper reports on the dielectric properties of multilayer PVDF-TrFE/PMMA:TiO2 thin film. Two samples were fabricated on ITO substrates; one with PVDF-TrFE only and another PMMA:TiO2 on PVDF-TrFE on (PVDF-TrFE/PMMA:TiO2). Both samples were produced by spin coating method. Dielectric properties were characterized using impedance spectroscopic. Dielectric constant, k, capacitance and dielectric loss, tan δ values of PMMA:TiO2/PVDF-TrFE were measured in the frequency range 0 – 50 kHz. The result for dielectric loss did not show any significant different between the samples with and without nanocomposite PVDF-TrFE layer. However, the dielectric constant are affected when depositing a nanocomposite PVDF-TrFE layer on PMMA:TiO2. The dielectric constant is decreased by 0.3 from 7.9 to 7.6.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.576
    DOI: 10.4028/www.scientific.net/AMR.576.582
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2012
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 18
    Online Resource
    Online Resource
    Influence of Post Annealing Temperature on the Properties of ZnO Films Prepared by RF Magnetron Sputtering
    Trans Tech Publications, Ltd. ; 2012
    In:  Advanced Materials Research Vol. 576 ( 2012-10), p. 602-606
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 576 ( 2012-10), p. 602-606
    Abstract: Zinc Oxide (ZnO) films were prepared on unheated glass substrate by radio frequency (RF) magnetron sputtering technique and post deposition annealing of the ZnO thin film were performed at 350, 400, 450 and 500°C. Post annealing temperature was found to improve the structural and electrical characteristics of the deposited films. The structural properties of the films were carried out by the surface profiler, X-Ray diffraction (XRD), atomic force microscopy (AFM) and field emission scanning electron microscope (FESEM) while the electrical properties were measured using current voltage (I-V) probe measurement system. All samples exhibit the (002) peak and the sample annealed at 500°C gives the highest crystalline quality, highest Rms roughness (1.819 nm) and highest electrical conductivity (3.28 x 10-3 Sm-1).
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.576
    DOI: 10.4028/www.scientific.net/AMR.576.602
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2012
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 19
    Online Resource
    Online Resource
    Effects of Annealling Treatment on the Properties of TiO〈sub〉2〈/sub〉/ZnO Thin Film Prepared by Simultaneous RF-Magnetron Sputtering
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 832 ( 2013-11), p. 573-578
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 832 ( 2013-11), p. 573-578
    Abstract: In this work, TiO 2 /ZnO nanocomposite films were prepared by simultaneous RF-magnetron sputtering of ZnO and TiO 2 targets. The influences of annealing temperature on the properties of the TiO 2 /ZnO films were investigated. The crystal structure of the deposited TiO 2 /ZnO films was hexagonal wurtzite at (002) and (101) peaks and the films were highly oriented along the c-axis perpendicular to the substrate. The photoluminescence (PL) spectrum reveals the appearance of two emission peaks from the deposited film that are centred at 384 and 591 nm. The structural, electrical, and optical properties of TiO 2 /ZnO films were strongly dependent on the annealing temperature. With increasing of the annealing temperature, the optical properties (i.e., UV, transmittance, energy band-gap and crystalline quality) were also improved. However, when the annealing is relatively high (≥ 500° C), the intensity of the optical properties and crystalline quality slightly decreases. The annealing temperature of (≥ 500° C) becoming the threshold temperature limits for the TiO 2 /ZnO film. The results obtained herein suggest that selecting the appropriate annealing temperature become a key factor for tuning the most desired properties from the as-prepared TiO 2 /ZnO thin films.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.832
    DOI: 10.4028/www.scientific.net/AMR.832.573
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 20
    Online Resource
    Online Resource
    Utilization of Soft Computing Techniques in Sputtering Processes: A Review
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 832 ( 2013-11), p. 260-265
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 832 ( 2013-11), p. 260-265
    Abstract: This paper presents an overview of research works on the utilizing of soft computing in the optimization of process parameters and in the prediction of thin film properties in sputtering processes. The papers from this review were obtained from relevant databases and from various scientific journals. The papers collected were published from 2008 to 2012. The focus of the review is to provide an outlook on the utilization of soft computing techniques in sputtering processes. Based on the review, the soft computing techniques which have been applied so far are ANN, GA and Fuzzy Logic. The first finding of this review is that soft computing technique is a promising and more reliable approach to optimize and predict process parameters compared to the traditional methods. The second finding is that the utilizing of soft computing techniques in sputtering processes are still limited and still in exploratory phase as they have not yet been extensively and stably applied. The techniques applied are also limited to ANN, GA and Fuzzy, whereas the exploration into other techniques is also necessary to be conducted in order to seek the most reliable technique and so as to expand the application of soft computing approach. Future research could focus on the exploration of other soft computing techniques for optimization in order to find the best optimization techniques based on the specific processes.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.832
    DOI: 10.4028/www.scientific.net/AMR.832.260
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...