Publication Date:
2013-06-22
Description:
Author(s): Fei Liu, Sissi de Beer, Dirk van den Ende, and Frieder Mugele We use atomic force microscopy to measure the distance-dependent solvation forces and the dissipation across liquid films of octamethylcyclotetrasiloxane (OMCTS) confined between a silicon tip and a highly oriented pyrolytic graphite substrate without active excitation of the cantilever. By analyzin... [Phys. Rev. E 87, 062406] Published Fri Jun 21, 2013
Keywords:
Films, Interfaces, and Crystal Growth
Print ISSN:
1539-3755
Electronic ISSN:
1550-2376
Topics:
Physics
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