In:
Journal of Applied Physics, AIP Publishing, Vol. 104, No. 12 ( 2008-12-15)
Abstract:
The authors demonstrate through dark injection space-charge-limited current (DI-SCLC) and trap-free SCLC measurements that an indium tin oxide (ITO)/buckminsterfullerene (C60) electrode can form a quasi-Ohmic contact with N,N′-bis(naphthalen-1-yl)-N,N′-bis(phenyl) benzidine (NPB). The DI-SCLC results show a clear peak current along with a shift of the peak position as the field intensity varies, implying an Ohmic (or quasi-Ohmic) contact. A theoretical simulation of the SCLC also shows that ITO/C60 forms an Ohmic contact with NPB when the electric field intensity is higher than 30 kV/cm. The Ohmic contact makes it possible to estimate the NPB hole mobility through the use of both DI-SCLC and trap-free SCLC analysis.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
2008
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
Permalink