In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 29, No. 4R ( 1990-04-01), p. 776-
Abstract:
Experimental verification of the theoretically derived resistivity correction factor F is presented. Factor F is applied to a system consisting of a rectangular parallelepiped sample and a square four-probe array. Resistivity and sheet resistance measurements are made on isotropic graphites and crystalline ITO films. Factor F corrects experimental data and leads to reasonable resistivity and sheet resistance.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1990
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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