In:
Powder Diffraction, Cambridge University Press (CUP), Vol. 16, No. 3 ( 2001-09), p. 149-152
Abstract:
The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα 1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.
Type of Medium:
Online Resource
ISSN:
0885-7156
,
1945-7413
Language:
English
Publisher:
Cambridge University Press (CUP)
Publication Date:
2001
detail.hit.zdb_id:
2047596-2
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