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  • Zhong, Ni  (5)
  • Physics  (5)
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  • Physics  (5)
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  • 1
    In: Applied Physics Letters, AIP Publishing, Vol. 117, No. 13 ( 2020-09-28)
    Abstract: Although a lot of promising two-dimensional (2D) semiconductors with various bandgaps, represented by black phosphorus (0.3 eV), transition metal dichalcogenides ( & lt; 2 eV), and boron nitride (5 − 6 eV), have been extensively researched in photoelectronic and electronic devices, the spectrum of large bandgap materials is still very narrow, which limits the potential device applications in ultraviolet photodetection. The broad family of layered thio- and seleno-phosphates with wide and tunable bandgaps (1.3 − 3.5 eV) can complement the intermediate bandgaps from 1.6 to 4 eV, which can fill the gap between transition metal dichalcogenides and boron nitride. In this work, a high-performance ultraviolet photodetector based on multilayered CuInP2S6 was fabricated. It exhibits fast response times shorter than 0.5 ms, i.e., rise time ∼ 0.36 ms and fall time ∼ 0.44 ms for ultraviolet illumination (280 nm, 50 nW), which is superior than previously reported 2D layered-based UV detectors. Significantly, this photodetector also shows ultralow dark current (∼ 100 fA), a high on/off ratio (∼103), and a specific detectivity of 7.38 × 1010 Jones. Our results provide an excellent candidate for low power consumption and high-speed photodetection.
    Type of Medium: Online Resource
    ISSN: 0003-6951 , 1077-3118
    RVK:
    Language: English
    Publisher: AIP Publishing
    Publication Date: 2020
    detail.hit.zdb_id: 211245-0
    detail.hit.zdb_id: 1469436-0
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  • 2
    In: Applied Physics Letters, AIP Publishing, Vol. 114, No. 10 ( 2019-03-11)
    Abstract: As an emerging phenomenon in oxide heterostructures, the ferroelectric control of electronic transport is attracting considerable research attention. However, the effect of ferroelectric polarization on resistive switching (RS) remains controversial. In this study, to determine the effects of ferroelectric polarization on memory characteristics, ferroelectric and non-ferroelectric BaTiO3 (BTO) films were fabricated using different oxygen partial pressures (Po2) during film growth. A correlated electron oxide, SmNiO3 (SNO), was selected as the bottom electrode. Based on piezoelectric force microscopy, ferroelectricity was verified in the BTO films prepared at Po2 ≥ 3 Pa, whereas the films fabricated at lower Po2 did not exhibit ferroelectricity. Remarkable RS with an ON/OFF ratio of 104% was clearly observed in heterostructures containing ferroelectric BTO, while RS was negligible in structures with non-ferroelectric BTO. The strong ferroelectricity dependence of RS behavior on the BTO/SNO heterostructures was attributed to the ferroelectric control of device transport between bulk-limited current in the low-resistance state and interface-limited conductance in the high-resistance state, which results from the modulation of the potential barrier at the BTO/SNO interface. The findings provide strong evidence for the dominant effect of ferroelectric polarization of BTO on the transport properties of BTO/SNO heterostructures.
    Type of Medium: Online Resource
    ISSN: 0003-6951 , 1077-3118
    RVK:
    Language: English
    Publisher: AIP Publishing
    Publication Date: 2019
    detail.hit.zdb_id: 211245-0
    detail.hit.zdb_id: 1469436-0
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  • 3
    Online Resource
    Online Resource
    AIP Publishing ; 2021
    In:  Applied Physics Letters Vol. 118, No. 7 ( 2021-02-15)
    In: Applied Physics Letters, AIP Publishing, Vol. 118, No. 7 ( 2021-02-15)
    Abstract: SrRuO3 (SRO) thin films have been grown on a (001)-oriented SrTiO3 substrate with Sr3Al2O6 (SAO) buffer layers using pulsed laser deposition. X-ray diffraction results reveal that the epitaxial strain of SRO changes from compressive to relaxed or tensile ones by tuning the thickness of the SAO buffer layer (tSAO). We have demonstrated that the variation of strain has a strong influence on the microstructure and electrical and magnetic properties of SRO. When tSAO & lt; 10 nm, the epitaxial strain is relaxed and the SRO film possesses higher Curie temperature resembling that of SRO bulk. Upon further increasing tSAO ≥ 10 nm, the SRO films are subjected to tensile strain, showing a typical step-and-terrace surface and coherent epitaxy characteristic on the SAO buffer layer. The electrical and magnetic properties of SRO are very sensitive to buffer layer-controlled epitaxial strain. The tensile strained SRO films show quite different electrical transport properties at low temperature, i.e., appearance of metal-insulator transition and positive magnetoresistances and the absence of non-Fermi-liquid behavior. Additionally, magnetic anisotropy is found in both the tensile and the compressively strained SRO, while the strain-relaxed film shows isotropic magnetization. Based on the electrical and magnetic properties, a phase diagram of SRO on the SAO buffer layer has been constructed.
    Type of Medium: Online Resource
    ISSN: 0003-6951 , 1077-3118
    RVK:
    Language: English
    Publisher: AIP Publishing
    Publication Date: 2021
    detail.hit.zdb_id: 211245-0
    detail.hit.zdb_id: 1469436-0
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  • 4
    In: Applied Physics Letters, AIP Publishing, Vol. 115, No. 24 ( 2019-12-09)
    Abstract: Ferroelectric thin films have been systematically investigated via scanning probe microscopy in recent years. Research indicates that the surface potential is the combined result of injected and polarization charges. The relationships between surface potentials and the two types of charges are usually investigated via scanning Kelvin probe microscopy (SKPM). Typically, SKPM investigations indicate that the surface charge distribution is dominated by injected charges trapped during poling using a conductive AFM tip rather than by polarization charges. The presence of injected charges leads to controversy concerning the origins of resistive switching behavior. In this study, relaxation of injected charges was observed during an optimized thermal treatment. This caused polarization charges to dominate over injected charges. Different electroresistance switching characterizations were observed via conductive atomic force microscopy (C-AFM) of injected and polarization charge-dominated films. Our research extends the methods of distinguishing whether electroresistance switching behavior is driven by charge trapping/detrapping or ferroelectric polarization. This provides an effective approach to classifying the origins of electroresistance switching in ferroelectric thin films by combining piezoelectric force microscopy, SKPM, and C-AFM.
    Type of Medium: Online Resource
    ISSN: 0003-6951 , 1077-3118
    RVK:
    Language: English
    Publisher: AIP Publishing
    Publication Date: 2019
    detail.hit.zdb_id: 211245-0
    detail.hit.zdb_id: 1469436-0
    Location Call Number Limitation Availability
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  • 5
    In: Applied Physics Letters, AIP Publishing, Vol. 117, No. 13 ( 2020-09-28)
    Abstract: The coexistence of distinct insulating and metallic phases within the same manganite sample, i.e., phase separation scenario, provides an excellent platform for tailoring the complex electronic and magnetic properties of strongly correlated materials. Here, based on an electric-double-layer transistor configuration, we demonstrate the dynamic control of two entirely different phases—canted G-type antiferromagnetic metal and C-type antiferromagnetic charge/orbital ordered insulator phase—in electron-doped system Ca1−xCexMnO3 (x = 0.05). The reversible metal-to-insulator transition, enhanced colossal magnetoresistance (∼ 27 000% for Vg = 3.0 V), and giant memory effect have been observed, which can be attributed to an electronic phase separation scenario manipulated by a tiny doping-level-variation of less than 0.02 electrons per formula unit. In addition, the controllable multi-resistance states by the combined application of magnetic and electrostatic fields may serve as an indicator to probe the dynamic multiphase competition of strongly correlated oxides. These results offer crucial information to understand the physical nature of phase separation phenomena in manganite systems.
    Type of Medium: Online Resource
    ISSN: 0003-6951 , 1077-3118
    RVK:
    Language: English
    Publisher: AIP Publishing
    Publication Date: 2020
    detail.hit.zdb_id: 211245-0
    detail.hit.zdb_id: 1469436-0
    Location Call Number Limitation Availability
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