In:
IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 8, No. 2 ( 2008-06), p. 368-374
Type of Medium:
Online Resource
ISSN:
1530-4388
,
1558-2574
DOI:
10.1109/TDMR.2008.919578
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2008
detail.hit.zdb_id:
2061445-7
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