In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 52, No. 8S ( 2013-08-01), p. 08JD01-
Abstract:
A strong electron accumulation was observed in a near-surface region of an as-grown nonpolar m -plane (101̄0) InN film by analyzing the valence band hard X-ray photoelectron spectra as a function of the take-off angle. In addition, two oxygen chemical states correlated with electron carrier concentration were observed in the O 1s core-level spectra. By comparing with the oxygen concentration in a bulk-like region, the amount of oxygen drastically increased in a near-surface region, suggesting that the oxygen atoms in the near-surface region act as donors to contribute to the near-surface electron accumulation layer.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.7567/JJAP.52.08JD01
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2013
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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