In:
Microscopy Research and Technique, Wiley, Vol. 69, No. 12 ( 2006-12), p. 998-1004
Kurzfassung:
A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip‐sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system. Microsc. Res. Tech., 2006. © 2006 Wiley‐Liss, Inc.
Materialart:
Online-Ressource
ISSN:
1059-910X
,
1097-0029
Sprache:
Englisch
Verlag:
Wiley
Publikationsdatum:
2006
ZDB Id:
1474912-9
SSG:
11
SSG:
12
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