In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 39, No. S1 ( 2000-01-01), p. 187-
Abstract:
Polycrystalline thin films of Cu-In-Se compounds and CuIn(S x Se 1- x ) 2 alloys have been grown on glass substrate by chemical spray pyrolysis (CSP). Films are characterized by X-ray diffraction, optical absorption and Raman measurements. The Cu-In-Se films with In/(Cu+In) 〉 0.57 exhibit a characteristic Raman peak. The optical bandgap energy of the Cu-In-Se film is approximately 1.22 eV for In/(Cu+In) 〈 0.67, and it increases from 1.22 to 1.36 eV as the In/(Cu+In) ratio increases from 0.67 to 0.75. Controllability of alloy composition of CuIn(S x Se 1- x ) 2 films is also discussed.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.7567/JJAPS.39S1.187
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2000
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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