In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 35, No. 5R ( 1996-05-01), p. 2822-
Abstract:
An ultrathin α-Sexithienyl (6T) film prepared by an organic molecular beam deposition method on a silver (Ag) film was studied by polarized near edge X-ray absorption fine structure (NEXAFS) spectroscopy using synchrotron radiation and IR-reflection absorption spectroscopy. The carbon K-edge NEXAFS spectrum of 6T was similar to those reported for poly-(3-methylthienylene) and thiophene. Polarized NEXAFS spectra of 6T exhibit strong angular dependence of 1 s→π * resonance intensity, showing that 6T molecules in the film deposited on the Ag film at room temperature had a highly oriented structure. To obtain quantitative information about molecular orientation, this dependence is analyzed by a comparison with theoretical calculation, indicating that the molecular axis is inclined by about 71° to the substrate surface. This angle is almost the same as that reported for 6T film on quartz.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.35.2822
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1996
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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