In:
Science, American Association for the Advancement of Science (AAAS), Vol. 276, No. 5321 ( 1997-06-27), p. 2004-2006
Abstract:
Variations in dielectric constant and patterns of microwave loss have been imaged in a yttrium-doped LiNbO 3 crystal with periodic ferroelectric domains with the use of a scanning-tip near-field microwave microscope. Periodic profiles of dielectric constant and images of ferroelectric domain boundaries were observed at submicrometer resolution. The combination of these images showed a growth-instability–induced defect of periodic domain structure. Evidence of a lattice-edge dislocation has also been observed through a stress-induced variation in dielectric constant.
Type of Medium:
Online Resource
ISSN:
0036-8075
,
1095-9203
DOI:
10.1126/science.276.5321.2004
Language:
English
Publisher:
American Association for the Advancement of Science (AAAS)
Publication Date:
1997
detail.hit.zdb_id:
128410-1
detail.hit.zdb_id:
2066996-3
detail.hit.zdb_id:
2060783-0
SSG:
11
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