In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 55, No. 11 ( 2016-11-01), p. 112402-
Kurzfassung:
The diffraction of γ-rays by mosaic Si crystals with thicknesses of 20, 40, and 80 mm and by a 2-mm-thick perfect Si crystal in a transmission Laue geometry was measured using a high-flux 60 Co source with an intensity of 2.2 TBq. The measured diffraction intensities at 1.17 and 1.33 MeV using 40- and 80-mm-thick mosaic crystals were enhanced by a factor of approximately 8.6 compared with those of the perfect Si crystal. The integrated reflectivity is well described in statistical dynamical theory by taking into account γ-ray absorption inside the crystals.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.7567/JJAP.55.112402
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
2016
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7
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