In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 62, No. SM ( 2023-11-01), p. SM1016-
Abstract:
Thickness dependence of the dielectric and piezoelectric properties of (1- x )Pb(Mg 1/3 Nb 2/3 )O 3 - x PbTiO 3 (PMN- x PT) single crystals ( x = 0.28, 0.29, and 0.30) grown using the modified Bridgman method was investigated. After annealing and repoling, the free dielectric constant of 7600 and the dielectric loss lower than 2.1% were obtained for 0.05 mm thick PMN-0.30PT, which are superior to previously reported properties for similar thicknesses. Although the free dielectric constant of PMN-0.28PT and PMN-0.29PT decreased by up to 10% as the sample thickness decreased from 0.30 to 0.05 mm, it improved after annealing and repoling, and remained stable at each thickness. From sample surface evaluations, a mechanically damaged layer was observed near the ground surface. This layer influences the crystal strain direction and crystal phases, suggesting that it influences the degradation properties.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.35848/1347-4065/ace6a9
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2023
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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