GLORIA

GEOMAR Library Ocean Research Information Access

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    In: Japanese Journal of Applied Physics, IOP Publishing, Vol. 57, No. 4S ( 2018-04-01), p. 04FR10-
    Type of Medium: Online Resource
    ISSN: 0021-4922 , 1347-4065
    RVK:
    RVK:
    RVK:
    Language: Unknown
    Publisher: IOP Publishing
    Publication Date: 2018
    detail.hit.zdb_id: 218223-3
    detail.hit.zdb_id: 797294-5
    detail.hit.zdb_id: 2006801-3
    detail.hit.zdb_id: 797295-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 2
    Online Resource
    Online Resource
    IMAPS - International Microelectronics Assembly and Packaging Society ; 2018
    In:  Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) Vol. 2018, No. HiTEC ( 2018-05-01), p. 000028-000031
    In: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT), IMAPS - International Microelectronics Assembly and Packaging Society, Vol. 2018, No. HiTEC ( 2018-05-01), p. 000028-000031
    Abstract: In this paper, we demonstrate that the structural degradation of a silicon carbide (SiC) power module corresponding to thermal cycles can be detected and tracked non-destructively by transient thermal analysis method. The purpose of this evaluation is to analyze the distribution of the thermal resistance in the power module and to identify the structure deterioration part. The power module with SiC-MOSFET were assembled using ZnAl eutectic solder as device under test. The individual thermal resistance of each part such as the SiC-die, the die-attachment, the AMCs, and the baseplate was successfully evaluated by analyzing the structure function graph. A series of thermal cycle test between −40 and 250°C was conducted, and the power modules were evaluated their thermal resistance taken out from thermal cycle test machine at 100, 200, 500 and 1000 cycles. We confirmed the increase in thermal resistance between AMCs and base plate in each thermal cycle. The portion where the thermal resistance increased is in good agreement with the location of the structural defect observed by scanning acoustic tomography (SAT) observation.
    Type of Medium: Online Resource
    ISSN: 2380-4491
    Language: English
    Publisher: IMAPS - International Microelectronics Assembly and Packaging Society
    Publication Date: 2018
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 3
    Online Resource
    Online Resource
    The Electrochemical Society ; 2016
    In:  ECS Transactions Vol. 75, No. 12 ( 2016-08-23), p. 117-122
    In: ECS Transactions, The Electrochemical Society, Vol. 75, No. 12 ( 2016-08-23), p. 117-122
    Abstract: This paper reports joining technology for Zn-Al solder without pressure during reflow process. SiC power devices can operate at temperatures over 200 ºC. Taking the advantage of this benefit, the cooling system which occupies a large volume in an inverter can be downsized. However, high melting point solder is required, such as Zn-Al solder. This solder was needed to pressure during reflow process because Zn-Al solder preform has stiff natural oxide film on its surface. We propose a new process for breaking the oxide film and creating temporary joining by ultrasonic bonding. As the result, the solder can join other components without pressure during reflow.
    Type of Medium: Online Resource
    ISSN: 1938-5862 , 1938-6737
    Language: Unknown
    Publisher: The Electrochemical Society
    Publication Date: 2016
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 4
    Online Resource
    Online Resource
    IMAPS - International Microelectronics Assembly and Packaging Society ; 2017
    In:  Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) Vol. 2017, No. HiTEN ( 2017-07-01), p. 1-5
    In: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT), IMAPS - International Microelectronics Assembly and Packaging Society, Vol. 2017, No. HiTEN ( 2017-07-01), p. 1-5
    Abstract: In this paper, we demonstrate that thermal degradation of silicon carbide (SiC) power modules corresponding to thermal cycles can be detected and tracked non-destructively by transient thermal analysis. The purpose of this evaluation is to analyze the distribution of the thermal resistance in the power module and to identify the structure deterioration part. As a target for evaluation power modules using a SiC-MOSFET for high-temperature operation were assembled with Zn-5Al eutectic solder. The junction to case thermal resistance was successfully evaluated as 0.85 K/W by using transient thermal analysis, and the thermal resistance of the Zn-5Al die-attachment was also evaluated as 0.13 K/W. A series of thermal cycle test between −40 and 250°C was conducted, and the power modules were evaluated their thermal resistance taken out from thermal cycle test machine at 100, 200, 500 and 1000 cycles. We identified the increase of thermal resistance each thermal cycle in specific modules. It was successfully shown that thermal resistance deterioration of SiC power module corresponding to thermal cycles can be traced non-destructively by this transient thermal analysis method.
    Type of Medium: Online Resource
    ISSN: 2380-4491
    Language: English
    Publisher: IMAPS - International Microelectronics Assembly and Packaging Society
    Publication Date: 2017
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 5
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2017
    In:  Materials Science Forum Vol. 897 ( 2017-5), p. 693-696
    In: Materials Science Forum, Trans Tech Publications, Ltd., Vol. 897 ( 2017-5), p. 693-696
    Abstract: In this paper, we propose a method to accurately calculate the turn-off switching loss. For that purpose, a simple analytical model is proposed in which the parasitic capacitances and stray inductances are integrated within the power module. Experiment confirmed that the turn-off loss analyzed by this model is correct.
    Type of Medium: Online Resource
    ISSN: 1662-9752
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2017
    detail.hit.zdb_id: 2047372-2
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 6
    Online Resource
    Online Resource
    IMAPS - International Microelectronics Assembly and Packaging Society ; 2017
    In:  Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) Vol. 2017, No. HiTEN ( 2017-07-01), p. 000197-000200
    In: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT), IMAPS - International Microelectronics Assembly and Packaging Society, Vol. 2017, No. HiTEN ( 2017-07-01), p. 000197-000200
    Abstract: We are developing SiC power module which can operate at high temperature. At present, SiC devices are attached by Au-Ge eutectic solder. In terms of cost, we are considering using Zn-Al solder instead of Au-Ge eutectic solder. For Zn-Al solder, joint reliability is reported for a small area bonding such as device connection. However, as far as we know, there is no report on the bonding reliability of large area such as base plate and substrate. Therefore, we report crack propagation by thermal cycle test on solder thickness.
    Type of Medium: Online Resource
    ISSN: 2380-4491
    Language: English
    Publisher: IMAPS - International Microelectronics Assembly and Packaging Society
    Publication Date: 2017
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 7
    Online Resource
    Online Resource
    The Electrochemical Society ; 2016
    In:  ECS Meeting Abstracts Vol. MA2016-02, No. 35 ( 2016-09-01), p. 2260-2260
    In: ECS Meeting Abstracts, The Electrochemical Society, Vol. MA2016-02, No. 35 ( 2016-09-01), p. 2260-2260
    Abstract: Introduction In this paper, we propose non-pressure soldering method during reflow process for Zn-Al solder by breaking oxide film on its surface in advance of heating. SiC power semiconductors can operate at a temperature of 200 °C or more. The temperature difference between junction of the semiconductors and ambient air makes effective heat dissipation, therefore the cooling system that occupies a large volume in an semiconductor power module can be minimized. If we use these advantages, we have to use high melting point solder such as Zn-Al alloy solder. But the solder, which is usually provided as preformed sheet, have stiff natural oxide film on its surface, therefore applying pressure to the preformed sheet during reflow process is necessary to break the oxide film for secure soldering. New proposed method don’t need these way. The reflow process becomes simplified. Method and Result Effectiveness of the joining method is described with Fig. 1. This figure shows fracture surfaces of samples after shear test. The samples are attempted to join a circuit pattern and a SiC dummy chip by soldering of Zn-Al preformed solder. The sample (a) is not given ultrasonic bonding before reflow. The preformed sheet of the sample (b) is attached to both the chip and the circuit pattern by ultrasonic bonding in advance of reflow. Then the two samples are heated in the same reflow process and evaluated based on shear test. As a result of the test, The chip of the sample (a) was easily peeled off. On the other hand, shear strength of (b) is 60.4 MPa on average. The reason of different results is described below. Since the natural oxide film was broken by ultrasonic bonding, and a newly formed surface is exposed, the solder and both the chip and the circuit pattern are mutually joined. When the sample is heated, the solder in the preformed sheet melts and overflows from the bonding surface. Therefore the chip and the circuit pattern are joined by soldering. Without breaking oxide film like (a) in advance of reflow, solder joint doesn’t occur. The proposed soldering method has a potential to be low-cost and simple process for packaging of SiC power semiconductors. Acknowledgment This work was supported by Council for Science, Technology and Innovation (CSTI), Cross-ministerial Strategic Innovation Promotion Program (SIP), "Next-generation power electronics/Consistent R & D of next-generation SiC power electronics", and "the Novel Semiconductor Power Electronics Project Realizing Low Carbon Emission Society" (funding agency: NEDO). Figure 1
    Type of Medium: Online Resource
    ISSN: 2151-2043
    Language: Unknown
    Publisher: The Electrochemical Society
    Publication Date: 2016
    detail.hit.zdb_id: 2438749-6
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...