In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 49, No. 7S ( 2010-07-01), p. 07HB01-
Abstract:
In this paper, a picosecond ultrasound measurement is conducted to evaluate the low-temperature elastic and optical properties of thin films and semiconductors. Specimens are cooled with liquid He through a heat exchanger in a cryostat, and an ultrahigh-frequency acoustic pulse is generated using a femtosecond light pulse, which propagates in the film-thickness direction. Pulse echoes of the longitudinal wave and Brillouin oscillation are observed by the changes in reflectivity of the time-delayed probe light, which depend on the material, and give the longitudinal-wave out-of-plane elastic constant. When the stiffness is known, the Brillouin oscillation provides the refractive index. We determined the stiffness of a Pt thin film and the refractive index of Si at 5 K. The methodology developed in this paper is useful for studing the elastic and optical properties of metallic thin films and transparent materials at cryogenic temperatures.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.49.07HB01
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2010
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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