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  • Trans Tech Publications, Ltd.  (11)
  • Kuo, Po Cheng  (11)
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  • Trans Tech Publications, Ltd.  (11)
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  • 1
    Online Resource
    Online Resource
    Co〈sub〉3〈/sub〉Pt Nanocomposite Films for Perpendicular Magnetic Recording Media
    Trans Tech Publications, Ltd. ; 2010
    In:  Advanced Materials Research Vol. 123-125 ( 2010-8), p. 27-30
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 123-125 ( 2010-8), p. 27-30
    Abstract: The Co3Pt magnetic layer with thickness of 7~28 nm was deposited onto the Pt underlayer. The as-deposited Co3Pt/Pt double-layered films with or without a 5 nm Pt capped layer were annealed at temperatures between 275 and 375 °C in vacuum of 1 mTorr. The influences of process parameters on perpendicular magnetic properties of Co3Pt thin films were investigated. The Co3Pt film with perpendicular coercivity (Hc⊥) value of 3620 Oe and the perpendicular squareness (S⊥) of 0.7 could be achieved from the Co3Pt(18 nm)/Pt(100 nm) double-layered films by annealing at 300°C. Further added Tb30Co70 film on the Co3Pt/Pt double-layered film could greatly enhance the perpendicular magnetic properties of the film. The Hc⊥ and S⊥ of the Tb30Co70/Co3Pt/Pt film were as high as 6560 Oe and 0.88, respectively, which has significant potential to be applied in perpendicular magnetic recording media.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.123-125
    DOI: 10.4028/www.scientific.net/AMR.123-125.27
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2010
    detail.hit.zdb_id: 2265002-7
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  • 2
    Online Resource
    Online Resource
    Effect of Thicknesses on the Microstructure and Magnetic Properties of CoPt Thin Films
    Trans Tech Publications, Ltd. ; 2010
    In:  Advanced Materials Research Vol. 123-125 ( 2010-8), p. 655-658
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 123-125 ( 2010-8), p. 655-658
    Abstract: The microstructures and magnetic properties of CoPt thin films with thicknesses between 1 and 20 nm deposited on amorphous glass substrate and post-annealing at 600°C for 30 min were investigated. The morphology of CoPt thin film would change from a discontinuous nano-size CoPt islands into a continuous film gradually as the film thickness was increased from 1 to 20 nm. The formation mechanism of the CoPt islands may be due to the surface energy difference between the glass substrate and CoPt alloy. Each CoPt island could be a single domain particle. This discontinuous nano-island CoPt recording film may increase the recording density and enhance the signal to noise ratio while comparing with the continuous film. The as-deposited 5 nm CoPt film revealed the separated islands morphology after annealing at 600°C for 30 min. This nano-size CoPt thin film may be a candidate for ultra-high density magnetic recording media due to its discontinuous islanded nanostructure.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.123-125
    DOI: 10.4028/www.scientific.net/AMR.123-125.655
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2010
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  • 3
    Online Resource
    Online Resource
    Preparation and Magnetic Properties Studies of Granular FePt Composite Films for High-Density Magnetic Recording
    Trans Tech Publications, Ltd. ; 2009
    In:  Advanced Materials Research Vol. 79-82 ( 2009-8), p. 855-858
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 79-82 ( 2009-8), p. 855-858
    Abstract: Granular (FePt)100-x–(NiO)x nanocomposite thin films with x in the range of 0 – 42 vol.% were fabricated on a natural-oxidized Si(100) substrate. It is found that both the coercivity and FePt domain size decrease with increasing NiO content for the (FePt)100-x–(NiO)x films. When the FePt-NiO nanocomposite film with NiO content of 10.4 vol.% is post-annealed at 750 °C with a high heating ramp rate of 100 °C/sec, the in-plane coercivity (Hc//) and perpendicular coercivity (Hc⊥) of the FePt films are 6.4 and 5.5 kOe, respectively. On the other hand, we used conductive atomic force microscope (CAFM) to confirm that the NiO compound is distributed at grain boundary of FePt grain that will constrain the domain size of FePt and obtain isolated magnetic domains. These results indicate that NiO addition is beneficial to enhance recoding density and reduce media noise of the FePt magnetic film.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.79-82
    DOI: 10.4028/www.scientific.net/AMR.79-82.855
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2009
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  • 4
    Online Resource
    Online Resource
    The Effect of Thickness on the Magnetic Anisotropy and Magnetic Properties of Single-Layered FePt Films by 〈i〉In Situ〈/i〉 Annealing
    Trans Tech Publications, Ltd. ; 2010
    In:  Advanced Materials Research Vol. 123-125 ( 2010-8), p. 507-510
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 123-125 ( 2010-8), p. 507-510
    Abstract: The FePt films with various thicknesses of 5 to 50 nm are deposited on Si(100) substrate without any underlayer by in-situ annealing at substrate temperature (Ts) of 620°C. A strong (001) texture of L10 FePt film is obtained and presents high perpendicular magnetic anisotropy as the film thickness increases to 30 nm. Further increasing the thickness to above 30 nm, the (111) orientation of L10 FePt is enhanced greatly, indicating that the quality of perpendicular magnetic anisotropy degrades when the FePt film is thicker than 30 nm. The single-layered FePt film with thickness of 30 nm by in-situ depositing at 620°C shows good perpendicular magnetic properties (perpendicular coercivity of 14.0 kOe, saturation magnetization of 473 emu/cm3 and perpendicular squareness of 0.96, respectively), which reveal its significant potential as perpendicular magnetic recording media for high-density recording.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.123-125
    DOI: 10.4028/www.scientific.net/AMR.123-125.507
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2010
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  • 5
    Online Resource
    Online Resource
    Microstructures and Magnetic Properties of Sputtered Expitaxial Co〈sub〉3〈/sub〉Pt/Pt Multilayer Films
    Trans Tech Publications, Ltd. ; 2008
    In:  Advanced Materials Research Vol. 47-50 ( 2008-6), p. 583-587
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 47-50 ( 2008-6), p. 583-587
    Abstract: Co3Pt films were deposited on Pt underlayers with various thicknesses by conventional sputtering in order to investigate the effect of Pt underlayers and annealing temperatures on their microstructure and the magnetic properties. From XRD and HRTEM analysises, as annealing at 300°C, a well epitaxial growth of Co3Pt (002) on Pt (111) underlayer that leads the film to present perpendicular magnetic anisotropy. However, Pt atoms in the Pt underlayer will diffuse seriously into Co3Pt layer as the annealing temperature is increased to 375°C that changes the compositions to approach equiatomic CoPt, and showing in-plane magnetic anisotropy with soft magnetic properties.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.47-50
    DOI: 10.4028/www.scientific.net/AMR.47-50.583
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2008
    detail.hit.zdb_id: 2265002-7
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  • 6
    Online Resource
    Online Resource
    Exchange Effect in TM-TbCo/RE-TbCo Double Layer Films
    Trans Tech Publications, Ltd. ; 2008
    In:  Advanced Materials Research Vol. 47-50 ( 2008-6), p. 781-784
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 47-50 ( 2008-6), p. 781-784
    Abstract: The High saturation magnetization (Ms) media are desired to yield large flux density for high resolution giant magnetoresistive head readout in Heat Assisted Magnetic Recording (HAMR). To ensure adequate stability of small size domains, the media for HAMR should possess large coercivity (Hc). In this work, we study of interface wall energy and the behavior of the magnetization of each layer in exchange coupled doubled-layered (ECDL) films. The Tb17Co83 (90 nm)/Tb30Co70 ECDL films with different Tb30Co70 thickness (20, 35, 50, 70, 90 nm) are made to increase the Ms value. As the thickness of Tb30Co70 film increase from 20 to 90 nm, the coercivity of the films increases from 2.5 to 8 kOe. The enhanced coercivity of ECDL films is due to the formation of domain wall at the interface of the ECDL film. As the Tb30Co70 increases from 20 to 90 nm, the Ms value of the films decreases from 380 to 330 emu/cm3. Due to Co has larger magnetic moment than that of Tb at room temperature, the resulting Ms value of the films decreases with increasing the thickness of Tb30Co70 layer.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.47-50
    DOI: 10.4028/www.scientific.net/AMR.47-50.781
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2008
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  • 7
    Online Resource
    Online Resource
    Fabrication of (200)-Textured NiO Films on Glass Substrate Using Radio Frequency Sputtering
    Trans Tech Publications, Ltd. ; 2009
    In:  Advanced Materials Research Vol. 79-82 ( 2009-8), p. 859-862
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 79-82 ( 2009-8), p. 859-862
    Abstract: The experimental result shows that the preferred orientations of NiO thin films are closely related to the working pressure of argon. All of NiO(111), NiO(200), and NiO(220) diffraction peaks are observed in the XRD patterns and exhibited random orientation of NiO film when the film is deposited in low Ar pressure of 5 mTorr. As the Ar pressure is increased to 20 mTorr, only NiO(200) peak appears and shows (200)-textured NiO films. However, the lattice parameter of NiO film deposited in high Ar pressure of 20 mTorr is 0.424 nm, which is much larger than that of NiO bulk (0.417 nm). The lattice parameter can be decreased by post-annealing the film due to the interstitial Ar atoms are released from the NiO lattice and it reduces continuously from 0.423 to 0.417 nm as the NiO films are annealed from 300 to 600 °C. Therefore, post-annealing the NiO film deposited in higher Ar pressure will reduce the lattice misfit between the NiO and L10 FePt film that is beneficial to improve the perpendicular magnetic anisotropy of FePt film.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.79-82
    DOI: 10.4028/www.scientific.net/AMR.79-82.859
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2009
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  • 8
    Online Resource
    Online Resource
    Magnetic Properties of Single-Layered Fe〈sub〉100-x〈/sub〉Pt〈sub〉x〈/sub〉 Films by Rapid Thermal Annealing
    Trans Tech Publications, Ltd. ; 2010
    In:  Advanced Materials Research Vol. 123-125 ( 2010-8), p. 723-726
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 123-125 ( 2010-8), p. 723-726
    Abstract: Fe100-xPtx single-layered films with Pt contents (x) = 32~69 at.% were deposited on natural-oxidized Si(100) substrate by dc magnetron sputtering. Then the films were post-annealed at 700 °C for 3 min by a rapid thermal annealing (RTA) with a high heating ramp rate of 100 °C/sec. Experimental results show that FePt film presented (111) preferred orientation and tended to in-plane magnetic anisotropy as the content of Pt was 32 at.%. When the Pt content was increased to 55 at.%, (001)-textured FePt film was obtained and presented perpendicular magnetic anisotropy. Its out-of-plane coercivity (Hc⊥), saturation magnetization (Ms) and out-of-plane squareness (S⊥) reached to 12.7 kOe, 375 emu/cm3 and 0.8, respectively. These results reveal its significant potential as perpendicular magnetic recording media for high-density recording. Further increasing the Pt content to 69 at.%, the coercivity of FePt film was decreased drastically to below 1 kOe and tended towards in-plane magnetic anisotropy.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.123-125
    DOI: 10.4028/www.scientific.net/AMR.123-125.723
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2010
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  • 9
    Online Resource
    Online Resource
    Microstructures and Magnetic Properties of Nanocomposite FePt Multilayer Films
    Trans Tech Publications, Ltd. ; 2008
    In:  Advanced Materials Research Vol. 47-50 ( 2008-6), p. 579-582
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 47-50 ( 2008-6), p. 579-582
    Abstract: Sputter-deposited FePt films exhibit an in-plane magnetic anisotropy when they use MgO as capped layer. The perpendicular magnetic anisotropy of FePt films are enhanced by introducing Ag capped layer instead of MgO capped layer. Although the in-plane coercivity (Hc⊥ ) of FePt films decreases slightly after introducing an Ag capper layer instead of a MgO capped layer, the perpendicular coercivity (Hc⊥ ) is increased significantly from 3169 Oe to 6726 Oe. The Auger electron spectroscopy analysis confirms that the Ag atoms diffuse from capped layer into the FePt magnetic layer and the Ag atoms mainly distribute at the grain boundary of FePt. This phenomenon results in the grain boundary energy enhancement and the grain growth inhibition and therefore increases the perpendicular coercivity and decrease the grain size of the FePt film.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.47-50
    DOI: 10.4028/www.scientific.net/AMR.47-50.579
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2008
    detail.hit.zdb_id: 2265002-7
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  • 10
    Online Resource
    Online Resource
    Effect of Annealing on Magnetic Properties and Domain Structures of FePt Thin Films by Rapid Thermal Annealing Technique
    Trans Tech Publications, Ltd. ; 2009
    In:  Advanced Materials Research Vol. 79-82 ( 2009-8), p. 911-914
    Details
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 79-82 ( 2009-8), p. 911-914
    Abstract: Single-layered FePt films of 30 nm thick were annealed at temperature between 300 and 800 °C for 1–180 sec by a rapid thermal annealing (RTA) with a high heating rate of 100 °C/sec. It is found that both the grain size and magnetic domain size of the FePt film increase with increasing annealing temperature and annealing time. The FePt films exhibited soft magnetic properties and without domain images were observed by magnetic force microscope (MFM) when the films were post-annealed at below 500 °C for 180 sec. The in-plane coercivity (Hc//) and perpendicular coercivity (Hc⊥) of FePt film increases significantly to 7.5 and 6.5 kOe respectively as annealing temperature increases to 600 °C. When the annealing temperature is increased to 700 °C, they are increased to 11.1 and 9.5 kOe, respectively, and the domain structure inclines to isolated domain. However, further increasing the annealing temperature to 800 °C, the Hc// and Hc⊥ values decrease to 9.8 and 8.9 kOe respectively due to largely increase the grain size of FePt and change the domain structure from isolation to continuity. On the other hand, in order to transform the FePt film from disordered γ phase to the ordered L10 phase, the annealing time of over 3 seconds is necessary when the film was post-annealed at 700 °C with a high heating rate of 100 °C/sec by RTA technique.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    URL: Article
    DOI: 10.4028/www.scientific.net/AMR.79-82
    DOI: 10.4028/www.scientific.net/AMR.79-82.911
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2009
    detail.hit.zdb_id: 2265002-7
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