In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 30, No. 3B ( 1991-03-01), p. L475-
Abstract:
As-grown Bi 2 (Sr, Ca) 3 Cu 2 O x and Bi 2 (Sr, Ca) 4 Cu 3 O x thin films with the (11 n ) orientation were formed on SrTiO 3 (110)
substrates by consecutive sputtering. RHEED patterns and XRD analysis indicated that the c -axis of the Bi 2 (Sr, Ca) 3 Cu 2 O x and Bi 2 (Sr, Ca) 4 Cu 3 O x films are tilted against the substrate surface by approximately 41° and 45°, respectively.
The Bi 2 (Sr, Ca) 3 Cu 2 O 3 film was found to have mainly a (117) orientation, whereas the Bi 2 (Sr, Ca) 4 Cu 3 O x film is considered to have mainly a (1110) orientation.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.30.L475
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1991
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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