In:
Key Engineering Materials, Trans Tech Publications, Ltd., Vol. 644 ( 2015-5), p. 227-231
Abstract:
Fe 50 (Pt 1 – x Pd x ) 50 (at. %, x = 0, 0.25, 0.5, 0.75, 1) alloy thin films are prepared on MgO(001) substrates by using two methods, high-temperature deposition at 600 °C (one-step method) and low-temperature deposition at 200 °C followed by annealing at 600 °C (two-step method). The influence of formation method on the film structure is investigated. L 1 0 crystals epitaxially grow on the substrates when films are deposited at 600 °C. Disordered crystals transform into L 1 0 structure when films are annealed at 600 °C. The films with x 〉 0.5 consist of L 1 0 (001) crystals with the c -axis normal to the substrate surface, whereas the films with x 〈 0.25 involve small volumes of L 1 0 (100) crystals with the c -axis lying in the film plane. Similar final crystallographic orientation is realized for the Fe (Pt,Pd) films prepared by employing the two different methods. The films prepared by one-step method possess island-like surfaces involving side facets, while those prepared by two-step method have very flat surfaces with the arithmetical mean roughness lower than 0.2 nm. The two-step method is effective for preparation of Fe (Pt,Pd) films with flat surfaces.
Type of Medium:
Online Resource
ISSN:
1662-9795
DOI:
10.4028/www.scientific.net/KEM.644
DOI:
10.4028/www.scientific.net/KEM.644.227
Language:
Unknown
Publisher:
Trans Tech Publications, Ltd.
Publication Date:
2015
detail.hit.zdb_id:
2073306-9
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