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  • Glaeser, Robert M.  (3)
  • 1980-1984  (3)
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  • 1980-1984  (3)
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  • 1
    In: Ultramicroscopy, Elsevier BV, Vol. 11, No. 1 ( 1983-1), p. 3-11
    Type of Medium: Online Resource
    ISSN: 0304-3991
    Language: English
    Publisher: Elsevier BV
    Publication Date: 1983
    detail.hit.zdb_id: 1479043-9
    SSG: 11
    SSG: 12
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  • 2
    Online Resource
    Online Resource
    Cambridge University Press (CUP) ; 1980
    In:  Proceedings, annual meeting, Electron Microscopy Society of America Vol. 38 ( 1980-08), p. 234-235
    In: Proceedings, annual meeting, Electron Microscopy Society of America, Cambridge University Press (CUP), Vol. 38 ( 1980-08), p. 234-235
    Abstract: We have investigated the possibility of using a charge coupled device (CCD) as a direct, electron-sensitive readout device for a CTEM. Two-dimensional imaging CCD's, developed as normal television camera elements, are semiconductor devices in which an image is formed on an array of photo-sensitive sites, causing the accumulation of an electric charge proportional to the incident flux. The video signal is generated by sequentially transferring the charges for each element of a line, in bucket-brigade fashion, to the input of the video amplifier. Sensitivity of the CCD to electrons has been demonstrated by the successful application in photocathode tubes, where the photoelectrons are accelerated to an energy up to 15 keV onto the image sensing area of the CCD. The application of the device in a 100 keV transmission electron microscope (Ferrier and Chapman, private communication), with the device in vacuo at the image plane, seems to have promising possibilities for image intensifier, electron counting, and computer input devices. A CCD readout system should have several advantages over previously designed video readout systems, including elimination of the phosphor, fiber optic or lens coupling, and intermediate image intensifier stages. The high gain and low noise of the device should allow detection of single electrons with a detective quantum efficiency near unity.
    Type of Medium: Online Resource
    ISSN: 0424-8201 , 2690-1315
    Language: English
    Publisher: Cambridge University Press (CUP)
    Publication Date: 1980
    SSG: 11
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  • 3
    Online Resource
    Online Resource
    Cambridge University Press (CUP) ; 1982
    In:  Proceedings, annual meeting, Electron Microscopy Society of America Vol. 40 ( 1982-08-13), p. 78-79
    In: Proceedings, annual meeting, Electron Microscopy Society of America, Cambridge University Press (CUP), Vol. 40 ( 1982-08-13), p. 78-79
    Abstract: The structural damage of molecules irradiated by electrons is generally considered to occur in two steps. The direct result of inelastic scattering events is the disruption of covalent bonds. Following changes in bond structure, movement of the constituent atoms produces permanent distortions of the molecules. Since at least the second step should show a strong temperature dependence, it was to be expected that cooling a specimen should extend its lifetime in the electron beam. This result has been found in a large number of experiments, but the degree to which cooling the specimen enhances its resistance to radiation damage has been found to vary widely with specimen types.
    Type of Medium: Online Resource
    ISSN: 0424-8201 , 2690-1315
    Language: English
    Publisher: Cambridge University Press (CUP)
    Publication Date: 1982
    SSG: 11
    Location Call Number Limitation Availability
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