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  • 1
    In: ECS Transactions, The Electrochemical Society, Vol. 102, No. 2 ( 2021-05-07), p. 29-35
    Abstract: The use of thin layers of amorphous hafnium oxide has been shown to be suitable for the manufacture of Resistive Random-Access memories (RRAM). These memories are of great interest because of their simple structure and non-volatile character. They are particularly appealing as they are good candidates for substituting flash memories. In this work, the performance of the MIM structure that takes part of a 4 kbit memory array based on 1-transistor-1-resistance (1T1R) cells was studied in terms of control of intermediate states and cycle durability. DC and small signal experiments were carried out in order to fully characterize the devices, which presented excellent multilevel capabilities and resistive-switching behavior.
    Type of Medium: Online Resource
    ISSN: 1938-5862 , 1938-6737
    Language: Unknown
    Publisher: The Electrochemical Society
    Publication Date: 2021
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  • 2
    In: ECS Meeting Abstracts, The Electrochemical Society, Vol. MA2021-01, No. 30 ( 2021-05-30), p. 1025-1025
    Abstract: In the search of materials with high charge storage densities to be used in the memory field, metal oxide perovskites such as lead zirconate titanate (PZT) result of particular interest due to its low leakage currents. Besides, ferroelectric PZT shows high remanent polarization. These properties make this material promising for high-speed and low-voltage non-volatile memories (J.F.Scott et al., J. Appl. Phys . 70 , 382, 1991). Due to its piezoelectric behavior, PZT has been most commonly used in the application of sensors and actuators. More recently, its usefulness in the energy harvesting field (H. Liu, J. Mat. Chem. A 8 , 19631, 2020), as well as for controlling electro-chemical processes (W. Quian et al. Nano-micro Letters 2020, https://doi.org/10.1007/s40820-020-00489-z), has been demonstrated. One of the main problems to overcome is the thermal incompatibility between this material and the specific ones of semiconductor devices. However, some efforts have been carried out in this respect (I. Bretos et al. Scientif. Rep. 6 :20143, 2016, doi: 10.1038/srep20143). PZT systems exhibit excellent electrical properties such as very high permittivity and thermal stability with low coercive field. Additionally, they present a high electromechanical coupling coefficient, and therefore they can be easily poled and feature a very high Curie Temperature, being fully operational across a wide temperature range. In this work, the variation of the ferroelectric behavior as a function of temperature was investigated. The samples used were PZT commercial structures manufactured by MuRata Manufacturing Co., Ltd.. Element sizes were 9 mm and 14 mm, for 7BB-12-9 and 7BB-20-6 samples, respectively. In Fig. 1(a), I-V curves in the 100-320 K temperature range show that, at low temperatures, the ferroelectric material requires higher voltage values in order to be polarized, and its polarization current diminishes. Furthermore, the coercive field increases quickly as the temperature drops (Fig. 1(b)). This can be explained by the fact that polarization switching is ruled by domain wall motion, which is a thermally activated process. The experimental results show that domain wall reversal becomes more difficult as temperature decreases. The impedance analysis was carried out by performing a simultaneous frequency and temperature sweep. Impedance resonances shifted towards higher frequencies as the samples got cooler (Fig. 2(b)) and their peak values grew as temperature decreased (Fig. 2(a)). This can be explained by the fact that the impedance is inversely proportional to the piezoelectric coefficients, which decrease in value with temperature (Silva de Freitas et al. https://doi.org/10.1016/j.sna.2015.11.031). In Fig. 3(a) the relationship between the coercive field and temperature is depicted for both samples 7BB-12-9 and 7BB-20-6. Here we can see a dependence in size that can only be explained by the fact that the smaller sample’s domain walls have less mobility. This means the crystalline grains of the 7BB-20-6 sample are significantly thinner than those of the 7BB-12-9. Thus, its domain walls have greater mobility, and the sample is easier to polarize. This is further demonstrated by analyzing Fig. 3(b) which presents the logarithmic plot of the measured relationship between polarization backswitching (Pr – Ps) and the inverse of the temperature for the two different size samples. Pr denotes the remnant polarization, whereas Ps is the saturation polarization. This fits an Arrhenius-like behavior only for temperatures above a certain threshold value ( 150 K for the 7BB-12-9 and 120 K for the 7BB-20-6) which is a new finding when studying previous works on this subject. These measurements verify the fact that the grains of the smaller sample are thicker, thus the movement of its domain walls is more difficult. This causes the saturated state to be less stable. Consequently, when the external electric field is removed, in the smaller sample a larger number of domains return to the situation of non-alignment, increasing the polarization backswitching. In summary, an exhaustive study of the ferroelectric behavior of PZT as a function of temperature has been carried out in order to deepen the knowledge of the underlying mechanisms for its use in the field of non-volatile memories. Figure 1
    Type of Medium: Online Resource
    ISSN: 2151-2043
    Language: Unknown
    Publisher: The Electrochemical Society
    Publication Date: 2021
    detail.hit.zdb_id: 2438749-6
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  • 3
    Online Resource
    Online Resource
    Institute of Electrical and Electronics Engineers (IEEE) ; 2020
    In:  IEEE Journal of the Electron Devices Society Vol. 8 ( 2020), p. 291-296
    In: IEEE Journal of the Electron Devices Society, Institute of Electrical and Electronics Engineers (IEEE), Vol. 8 ( 2020), p. 291-296
    Type of Medium: Online Resource
    ISSN: 2168-6734
    Language: Unknown
    Publisher: Institute of Electrical and Electronics Engineers (IEEE)
    Publication Date: 2020
    detail.hit.zdb_id: 2696552-5
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  • 4
    In: ECS Transactions, The Electrochemical Society, Vol. 102, No. 2 ( 2021-05-07), p. 45-59
    Abstract: This work deals with the thermoelectric characterization of commercial lead zirconate titanate (PZT) based piezoelectric diaphragms. An in-depth analysis of the piezo- and ferroelectric behavior of the samples was carried out by measuring current voltage curves and polarization hysteresis cycles in a wide temperature range. We demonstrate that, as the temperature decreases, higher electric fields are needed to completely polarize the sample. Furthermore, I-V measurements, polarization hysteresis loops and coercive fields allow us to confirm that the samples present different grain sizes. From impedance measurements, resonance frequency values, capacitance and permittivity were determined at temperatures ranging from 100 to 320 K. It is shown that impedance maxima shift towards greater frequency values when decreasing the temperature, which is mainly attributed to the appearance of an internal stress that generates larger stiffness in the ceramic. Finally, an electroacoustic characterization was made by measuring the sound pressure of the diaphragms in the human hearing frequency range.
    Type of Medium: Online Resource
    ISSN: 1938-5862 , 1938-6737
    Language: Unknown
    Publisher: The Electrochemical Society
    Publication Date: 2021
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  • 5
    In: ECS Meeting Abstracts, The Electrochemical Society, Vol. MA2021-01, No. 30 ( 2021-05-30), p. 995-995
    Abstract: The use of thin layers of amorphous hafnium oxide has been shown to be suitable for the manufacture of Resistive Random Access memories (RRAM). These memories are of great interest because of their simple structure and non-volatile character. In this work, it was studied the performance of the MIM structure that takes part of a 4 kbit memory array based on 1-transistor-1-resistance (1T1R) cells, in terms of memory maps and reading and writing loops. In each cell of the memory, a NMOS transistor is placed in series to a metal-insulator-metal (MIM) resistor formed by a TiN/a-HfO 2 /Ti/TiN structure. The 8 nm-thick HfO 2 layers were grown by Atomic Layer Deposition (ALD); all metal films were deposited by magnetron sputtering. The measurements were carried out on MIM structures identical to those of the memory cell but with a larger area, manufactured on a different region of the chip. A previous study about the reduction of the programming pulse width in order to accomplish fast and low-energy switching operations as well as its influence in terms of endurance and data retention times has been published ( Pérez et al. Electronics 9 , p. 864, 2020 ). In addition, Logic-In-Memory (LIM) circuits based on this 4-kb RRAMs arrays have been analyzed in terms of reliability and energy consumption tradeoff ( Zanotti et al. IEEE Trans. Electron. Devices 67 , 10, p. 4611, 2020 ). In these MIM structures, the resistance value may decrease due to the creation of oxygen vacancy columns that act as conductive filaments between the two electrodes. This process is reversible and controllable, so that two well-defined states can be established. In addition, it is also possible to access intermediate states if appropriate dc bias waveforms are applied. In fact, by biasing with variable amplitude-triangular voltage signals, cumulative writing and erasing cycles can be performed. To obtain the memory maps, return-to-zero pulses rather than ramp voltages bias have to be used. Accordingly, the samples are biased by a train of square pulses with increasing amplitude; after each pulse the current value under a low bias value is measured. The memory map is built from the current values at 0.1 V measured immediately after applying each programming pulse. To carry out a detailed electrical characterization of these devices becomes essential to shed light on the physical nature of the mechanisms of creation and dissolution of the conducting filament, and ultimately to control the memory states. The controllable multilevel ability of these memory devices, due to their resistance transition in a gradual way, enables them to be used not only in the RAM memory field, but also in neuromorphic circuits based on the artificial synapse. It has been shown in HfO 2 -based RRAM devices that small signal parameters in a wide range of frequencies also show repetitiveness and intermediate states control, and allow to obtain memory maps testing the device at 0 V dc bias, hence without any static power consumption. ( Castán et al. J. Appl. Phys. 124, 152101, 2018 ). In Fig. 1.a I-V cycles showing SET and RESET states are depicted. The blue-colored cycles are the most stable, whereas the very initial ones (red color) show some instability due to the fact that the filament formation process does not seem to have finished yet, and the last ones (green color) already exhibit aging effects. The memory map in Fig.1.b shows good window width values. SET transition is markedly abrupt compared to RESET transitions, which is much more gradual. This means that the best control can be obtained in the RESET transition. The accuracy of the intermediate current values control between SET and RESET is clearly shown in Figs. 1.c and 1.d. Both write and erase operations are carried out incrementally with a very precise control of the successive states through which the memory passes. The initial state must be well established by driving the memory to a full RESET (write operation) or to a full SET (erase operation). To achieve this, a negative or positive enough voltage, respectively, should be applied to the top electrode (with bottom electrode grounded). Similarly, an accurate control of admittance parameters was achieved during cumulative writing and erasing processes. Memory maps were also plotted for real (conductance, G) and imaginary (capacitance, C) components (Fig. 2). Moreover, endurance measurements made up to 6144 SET-RESET cycles exhibited excellent repetitiveness of current values in both states, as well as admittance parameters stability. To sum up, the electrical properties of these RRAM devices in terms of endurance and intermediate states control make them suitable for neuromorphic computing. Figure 1
    Type of Medium: Online Resource
    ISSN: 2151-2043
    Language: Unknown
    Publisher: The Electrochemical Society
    Publication Date: 2021
    detail.hit.zdb_id: 2438749-6
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  • 6
    Online Resource
    Online Resource
    Institute of Electrical and Electronics Engineers (IEEE) ; 2016
    In:  IEEE Transactions on Electron Devices Vol. 63, No. 5 ( 2016-5), p. 1877-1883
    In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 63, No. 5 ( 2016-5), p. 1877-1883
    Type of Medium: Online Resource
    ISSN: 0018-9383 , 1557-9646
    Language: Unknown
    Publisher: Institute of Electrical and Electronics Engineers (IEEE)
    Publication Date: 2016
    detail.hit.zdb_id: 2028088-9
    detail.hit.zdb_id: 241634-7
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