In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 33, No. 6S ( 1994-06-01), p. 3752-
Abstract:
We used an atomic force microscope combined with a lateral force microscope (AFM/LFM) as a two-dimensional frictional force microscope (2D-FFM) to investigate the two-dimensional behavior of the atomic-scale friction between the cleaved surface of MoS 2 and the Si 3 N 4 tip apex of the microcantilever based on the two-dimensional stick-slip model. As a result, for the scan direction along the row of the stick-points, we found the unstable state where the tip apex shows fluctuation between two adjacent rows of stick-points. On the other hand, near the row of the stick-points, we also found the stable state where the tip apex takes a straight walk on a row of the stick-points without fluctuation.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.33.3752
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1994
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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