In:
MRS Proceedings, Springer Science and Business Media LLC, Vol. 259 ( 1992)
Abstract:
X-ray photoelectron spectroscopy, X-ray photoelectron diffraction, and S K edge X-ray absorption near-edge structure were used to characterize the air-stable S-passivated InP(100)-(lxl) surface prepared in (NH 4 ) 2 S solution. The results show that one monolayer of sulphur which is bonded only to In is adsorbed on the surface. The S is found to occupy bridge-bonded sites, and the orientation of the In-S bond is determined to be in the [011] azimuth, with an In-S-In bridge-bond angle of about 100°.
Type of Medium:
Online Resource
ISSN:
0272-9172
,
1946-4274
DOI:
10.1557/PROC-259-299
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
1992
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