In:
Journal of Applied Physics, AIP Publishing, Vol. 114, No. 24 ( 2013-12-28)
Abstract:
In this paper, Cu-doped GeTe materials have been investigated for high-temperature phase change memory (PCM) application. Cu incorporated in GeTe increases the crystallization temperature, crystallization active energy, and band gap significantly. The incorporated Cu has effect on refining the crystal growth and brings more number of bonds in GeTe, and has remarkable effect on improving the thermal stability of GeTe. The 10-year data retention of Cu0.06(GeTe)0.94 and Cu0.13(GeTe)0.87 are 151 °C and 185 °C, which is higher than that of GeTe. PCM device based on Cu0.06(GeTe)0.94 exhibits faster switching speed than that of GeTe. In addition, Cu0.06(GeTe)0.94 shows endurance up to 2.8 × 103 cycles with an on/off ratio of two orders of magnitude.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
2013
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
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