In:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 23, No. 6 ( 2005-11-01), p. 3209-3213
Abstract:
Atomic layer deposition, a highly uniform and conformal deposition process, was utilized to fill trenches of various high aspect-ratio nano-grating structures. Dielectric (e.g., SiO2), metal (e.g., aluminum), and dielectric/metal (e.g., Au∕SiO2) hybrid nano-gratings with a linewidth down to & lt;50nm and an aspect ratio up to 14:1 (700nm:50nm) were trench-filled with various materials particularly nano-laminate materials such as TiO2∕SiO2 and SiO2∕Al2O3. Various high-performance optical devices such as true-zero-order optical retarders (i.e., wave plates) and nanowire-grid polarizers were realized based on an UV-nanoimprint lithography process and the atomic layer deposition for trench fillings. Thanks to both unique material properties and nano-structure trench filling capability, the atomic layer deposition opens a path for innovative nano-structure based optical devices and integrated optical devices.
Type of Medium:
Online Resource
ISSN:
1071-1023
,
1520-8567
Language:
English
Publisher:
American Vacuum Society
Publication Date:
2005
detail.hit.zdb_id:
3117331-7
detail.hit.zdb_id:
3117333-0
detail.hit.zdb_id:
1475429-0
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