In:
Microelectronics Reliability, Elsevier BV, Vol. 45, No. 9-11 ( 2005-9), p. 1394-1397
Type of Medium:
Online Resource
ISSN:
0026-2714
DOI:
10.1016/j.microrel.2005.07.035
Language:
English
Publisher:
Elsevier BV
Publication Date:
2005
detail.hit.zdb_id:
2022028-5
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