Online Resource
Mueller, D.
;
Ono, M.
;
Bell, M.G.
;
[et al.]
Bell, R.E.
;
Bitter, M.
;
Bourdelle, C.
;
Darrow, D.S.
;
Efthimion, P.C.
;
Fredrickson, E.D.
;
Gates, D.A.
;
Goldston, R.J.
;
Grisham, L.R.
;
Hawryluk, R.J.
;
Hill, K.W.
;
Hosea, J.C.
;
Jardin, S.C.
;
... and further 72
Institute of Electrical and Electronics Engineers (IEEE)
;
2003
In:
IEEE Transactions on Plasma Science Vol. 31, No. 1 ( 2003-02), p. 60-67
In:
IEEE Transactions on Plasma Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 31, No. 1 ( 2003-02), p. 60-67
Type of Medium:
Online Resource
ISSN:
0093-3813
DOI:
10.1109/TPS.2003.808890
Language:
English
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2003
detail.hit.zdb_id:
2025402-7
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