In:
Journal of Applied Physics, AIP Publishing, Vol. 85, No. 9 ( 1999-05-01), p. 6923-6925
Kurzfassung:
We have analyzed the aberrations and allowances for an aspheric error, a thickness error, and an air gap in a hemisphere solid immersion lens for photoluminescence microscopy with submicron resolution beyond the diffraction limit, where light with large ray angle and the effect of an evanescent field play important roles.
Materialart:
Online-Ressource
ISSN:
0021-8979
,
1089-7550
Sprache:
Englisch
Verlag:
AIP Publishing
Publikationsdatum:
1999
ZDB Id:
220641-9
ZDB Id:
3112-4
ZDB Id:
1476463-5
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