In:
Laser & Optoelectronics Progress, Shanghai Institute of Optics and Fine Mechanics, Vol. 59, No. 4 ( 2022), p. 0417001-
Materialart:
Online-Ressource
ISSN:
1006-4125
Originaltitel:
Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy
DOI:
10.3788/LOP/2022/59/4
DOI:
10.3788/LOP202259.0417001
Sprache:
Englisch
,
Chinesisch
Verlag:
Shanghai Institute of Optics and Fine Mechanics
Publikationsdatum:
2022
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