In:
Chinese Optics Letters, Shanghai Institute of Optics and Fine Mechanics, Vol. 13, No. 9 ( 2015), p. 091404-91408
Type of Medium:
Online Resource
ISSN:
1671-7694
Uniform Title:
Multiscale analysis of single- and multiple-pulse laser-induced damages in HfO2/SiO2 multilayer dielectric films at 532 nm
DOI:
10.3788/COL/2015/13/9
DOI:
10.3788/COL201513.091404
Language:
English
,
Chinese
Publisher:
Shanghai Institute of Optics and Fine Mechanics
Publication Date:
2015
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