In:
Chinese Optics Letters, Shanghai Institute of Optics and Fine Mechanics, Vol. 20, No. 11 ( 2022), p. 113601-
Type of Medium:
Online Resource
ISSN:
1671-7694
Uniform Title:
Fast dual-beam alignment method for stimulated emission depletion microscopy using aggregation-induced emission dye resin
DOI:
10.3788/COL/2022/20/11
DOI:
10.3788/COL202220.113601
Language:
English
,
Chinese
Publisher:
Shanghai Institute of Optics and Fine Mechanics
Publication Date:
2022
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