In:
Eksploatacja i Niezawodność – Maintenance and Reliability, Polskie Naukowo-Techniczne Towarzystwo Eksploatacyjne, Vol. 22, No. 2 ( 2020-6-30), p. 221-231
Abstract:
The reliability analysis of MEMS gyroscope under long-term operating condition has become an urgent requirement with the
enlargement of its application scope and the requirement of good durability. In this study we propose a lifetime prediction method for MEMS gyroscope based on accelerated degradation tests (ADTs) and acceleration factor model. Firstly, the degradation
characteristic (bias instability) is extracted based on Allan variance. The effect of temperature stress on the degradation rate of bias instability is analyzed, and it shows that the degradation rate of bias instability would increase with the increase of the
temperature. Secondly, the ADTs of MEMS gyroscope are designed and conducted, the degradation model of MEMS gyroscope is established based on the output voltage of MEMS gyroscope and Allan variance. Finally, the acceleration factor model of MEMS gyroscope under temperature stress is derived, and the lifetime of the MEMS gyroscope is predicted based on two group tests data
under high stress level. The results show that the lifetime calculated by the acceleration factor model and mean lifetime under high stress levels is close to the mean lifetime calculated by the linear equation at normal temperature stress.
Type of Medium:
Online Resource
ISSN:
1507-2711
,
2956-3860
Uniform Title:
Metoda prognozowania czasu pracy żyroskopu MEMS na podstawie testu przyspieszonej degradacji i modelu współczynnika przyspieszenia
DOI:
10.17531/ein.2020.2.5
Language:
Polish
Publisher:
Polskie Naukowo-Techniczne Towarzystwo Eksploatacyjne
Publication Date:
2020
detail.hit.zdb_id:
2257067-6
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