In:
Materials, MDPI AG, Vol. 12, No. 1 ( 2019-01-03), p. 138-
Abstract:
Strontium titanate thin films were deposited on a silicon substrate by radio-frequency magnetron sputtering. The structural and optical properties of these films were characterized by X-ray diffraction, high-resolution transmission electron microscopy, X-ray photoelectron spectroscopy, and spectroscopic ellipsometry, respectively. After annealing at 600–800 °C, the as-deposited films changed from amorphous to polycrystalline. It was found that an amorphous interfacial layer appeared between the SrTiO3 layer and Si substrate in each as-deposited film, which grew thicker after annealing. The optical parameters of the SrTiO3 film samples were acquired from ellipsometry spectra by fitting with a Lorentz oscillator model. Moreover, we found that the band gap energy of the samples diminished after thermal treatment.
Type of Medium:
Online Resource
ISSN:
1996-1944
Language:
English
Publisher:
MDPI AG
Publication Date:
2019
detail.hit.zdb_id:
2487261-1
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