In:
MRS Proceedings, Springer Science and Business Media LLC, Vol. 558 ( 1999)
Abstract:
The intrinsic degradation of tris (8-hydroxyquinoline) aluminum (AlQ 3 )-based organic light emitting devices, that leads to the long-term decrease in the electroluminescence efficiency of the devices operated under constant current conditions, is studied. The injection of holes in A1Q 3 is found to be the main factor responsible for device degradation. OLEDs with dual HTLs in different arrangements are also presented to demonstrate the proposed degradation mechanism. The role of various approaches to increase OLED lifetime, such as, doping the hole transport layer, introducing a buffer layer at the hole-injecting contact, or using a mixed emitting layer of hole and electron transporting molecules, is explained.
Type of Medium:
Online Resource
ISSN:
0272-9172
,
1946-4274
DOI:
10.1557/PROC-558-507
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
1999
Permalink