In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 51, No. 10S ( 2012-10-01), p. 10NF04-
Abstract:
Photovoltaic modules with single-crystalline silicon cells and multi-crystalline silicon cells, which were exposed outside for over nine years from 1992, have been evaluated for their failures. Current–voltage characteristic, electroluminescence, and thermography (dark mode) measurement of the modules were carried out as well as those of each solar cell in the modules. Application of these measurements in combination has been shown to be beneficial for investing the failure positions and failure factors in the modules. A new method of analyzing the positions of interconnection failures in modules was also adopted in the present study that is by using electroluminescence measurement and by connecting wires to the interconnector of each individual solar cell.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.51.10NF04
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2012
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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