In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 61, No. 2 ( 2022-02-01), p. 025501-
Abstract:
We report the stabilization of metastable tetragonal BiFeO 3 epilayer on ZnO(0001) surface. X-ray reciprocal space map characterizations show that the BiFeO 3 film is of true tetragonal symmetry, but not the commonly observed monoclinic structure. The critical thickness of the tetragonal BiFeO 3 is higher than 140 nm, much larger than that reported previously. Despite the considerable lattice mismatch and symmetry mismatch, tetragonal BiFeO 3 can be formed on ZnO(0001) though domain matching epitaxy which is featured by anisotropic growth. We show that by taking into account the elastic energy during the initial semi-coherent growth, the tetragonal phase is lower than the thermally stable rhombohedral phase in total energy by 70 meV per formula unit. Moreover, local piezoelectric characterizations reveal a coercive field of 360 kV cm −1 and a piezoelectric constant of 48 pm V −1 . The integration of tetragonal BiFeO 3 with robust ferroelectricity on the platform of ZnO has potentials for all-oxide electronics applications.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.35848/1347-4065/ac45a6
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2022
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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