In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 40, No. 4R ( 2001-04-01), p. 2447-
Abstract:
The surface images of a SiO 2 pattern on Si(100) was observed by three types of electron emission microscopies, i.e., metastable electron emission microscopy (MEEM) with metastable He, photoelectron emission microscopy (PEEM) and low-energy electron emission microscopy (LEEM). Among these, MEEM gave the most diffused image at the pattern edges of the SiO 2 region. Furthermore, it is found that the difference in MEEM, LEEM and PEEM images can provide new information on the spatial distribution of surface electronic states. By comparing MEEM, LEEM and PEEM images, it is expected that we can obtain local information on surface electronic states in more detail.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.40.2447
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2001
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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