In:
EPL (Europhysics Letters), IOP Publishing, Vol. 135, No. 6 ( 2021-09-01), p. 67003-
Abstract:
In this study, a radio frequency magnetron sputtering technique was applied to deposit eminently oriented ZnO thin films on stainless steel (SS316L). The effect of different ratios (Ar:O 2 ) of gas flow ((20:0), (15:5), (10:10), (5:15), (0:20)) on optical and structural properties of CeO 2 -doped ZnO thin films has been examined. The increase in grain size of thin films was observed with a partial increase in the Ar:O 2 sputtering gas at substrate temperature of 673 K. The average surface roughness of the thin films has increased with sputtering gas. The photoluminescence peak exhibited a broad green-yellow band spiked at 467 nm for all the samples of CeO 2 -doped ZnO thin films and a wide band of visible light focused in the 500–600 nm range. Intensity reduction of deep level emission peaks of ZnO films was observed. The refractive index of undoped and CeO 2 -doped ZnO thin films with various sputtering gas ratios (Ar:O 2 ) were also investigated. The optimized argon gas flow rate findings allow us to choose the deposition conditions for CeO 2 -doped ZnO thin films for solar thermal applications.
Type of Medium:
Online Resource
ISSN:
0295-5075
,
1286-4854
DOI:
10.1209/0295-5075/ac2d55
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2021
detail.hit.zdb_id:
1465366-7
detail.hit.zdb_id:
165776-8
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