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  • 1
    Online Resource
    Online Resource
    Newark :John Wiley & Sons, Incorporated,
    Keywords: Polarization (Light)-Measurement. ; Electronic books.
    Type of Medium: Online Resource
    Pages: 1 online resource (563 pages)
    Edition: 1st ed.
    ISBN: 9781119758495
    Series Statement: IEEE Press Series
    DDC: 620.11295
    Language: English
    Note: Cover -- Title Page -- Copyright -- Contents -- Author Biographies -- Preface -- Chapter 1 History of Light and Polarization -- 1.1 Early History of Light -- 1.2 History of Polarization -- 1.3 History of Polarization in Optical Fibers and Waveguides -- 1.3.1 The History of Optical Fiber -- 1.3.2 History of Polarization in Optical Fibers -- 1.3.3 Chronicles of Polarization Optics in Optical Fibers from 1959 to 1981 -- References -- Further Reading -- Chapter 2 Polarization Basics -- 2.1 Introduction to Polarization -- 2.2 The Degenerate Polarization States of Light -- 2.3 The Polarization Ellipse of Light -- 2.4 Poincaré Sphere Presentation of Polarization -- 2.5 Degree of Polarization (DOP) -- 2.6 Birefringence -- 2.7 Photoelasticity or Photoelastic Effect -- 2.8 Dichroism, Diattenuation, and Polarization Dependent Loss -- 2.9 Polarization Properties of Reflected and Refracted Light -- 2.9.1 Reflection -- 2.9.2 Refraction -- References -- Further Reading -- Chapter 3 Polarization Effects Unique to Optical Fiber Systems -- 3.1 Polarization Variation in Optical Fibers -- 3.2 Polarization Eigenmodes in a Single Mode Optical Fiber -- 3.3 Birefringence Contributions in Optical Fibers -- 3.3.1 Noncircular Core -- 3.3.2 Internal Lateral Stress -- 3.3.2.1 Elliptical Cladding -- 3.3.2.2 Circular Stress Rods -- 3.3.2.3 Bow‐Tie Shaped Stress Rods -- 3.3.3 External Lateral Stress -- 3.3.3.1 Fiber Between Parallel Plates -- 3.3.3.2 Fiber in an Angled V‐Groove -- 3.3.4 Fiber Bending -- 3.3.4.1 Pure‐Bend -- 3.3.4.2 Bending with Tension -- 3.3.4.3 Bending with a Kink -- 3.3.5 Fiber Twist -- 3.3.6 Electrical and Magnetic Fields -- 3.3.6.1 Axial Magnetic Field (The Faraday Effect) -- 3.3.6.2 Transversal Electrical Field -- 3.4 Polarization Impairments in Optical Fiber Systems -- 3.4.1 Polarization Mode Dispersion (PMD) -- 3.4.2 Polarization Dependent Loss (PDL). , 3.4.3 Polarization Dependent Gain (PDG) -- 3.4.4 Polarization Dependent Wavelength (PDW) -- 3.4.5 Polarization Dependent Modulation (PDM) -- 3.4.6 Polarization Dependent Responsivity (PDR) -- 3.5 Polarization Multiplexing -- 3.6 Polarization Issues Unique to Optic Fiber Sensing System -- 3.7 Polarization Issues Unique to Microwave Photonics Systems -- References -- Chapter 4 Mathematics for Polarization Analysis -- 4.1 Jones Vector Representation of Monochromatic Light -- 4.1.1 Jones Vector -- 4.1.2 Orthogonality of Jones Vectors -- 4.1.3 Linear Independence of Jones Vectors -- 4.2 Jones Matrix of Optical Devices -- 4.2.1 Jones Matrix of Optical Elements -- 4.2.1.1 Linear Retarder and Linear Partial Polarizer in Principal Coordinates -- 4.2.1.2 Ideal Retarder in Principal Coordinates -- 4.2.1.3 The Ideal Partial Polarizer in Principal Coordinates -- 4.2.1.4 Jones Matrix of a Rotator -- 4.2.1.5 Jones Matrix Transformation Between Two Reference Frames -- 4.2.2 Jones Matrix of Reflection -- 4.2.2.1 Law of Reflection -- 4.2.2.2 Snell's Law -- 4.2.2.3 Fresnel's Equations -- 4.2.3 Polarization Compensation of Reflection -- 4.2.4 Polarization Properties of Corner‐Cube Retroreflector -- 4.3 Jones Matrix of Multi‐element Optical Systems -- 4.3.1 Jones Equivalent Theorems -- 4.3.2 Properties of Optical System Containing Only Retarders and Rotators -- 4.3.2.1 A Variable Rotator Constructed with Three Retarders -- 4.3.2.2 A Variable Wave Plate Constructed with a Rotator Between Two Quarter‐Wave Plates -- 4.3.3 Eigenvector and Eigenvalue of an Optical System -- 4.3.3.1 The Eigenvalues and Eigenvectors of Retardation Plate -- 4.3.3.2 The Eigenvalues and Eigenvectors of a Unitary Matrix -- 4.3.3.3 Obtaining Jones Matrix from Eigenvectors and Eigenvalues -- 4.3.4 Transmission Properties of an Optical System Including Partial Polarizers. , 4.3.5 Experimental Measurement of Jones Matrix -- 4.3.6 Jones Calculus in Retracing Optical Path -- 4.3.6.1 Jones Matrix of a Double‐Pass Optical System with a Mirror -- 4.3.7 N‐Matrix and Polarization Evolution -- 4.3.7.1 Expression of M in Terms of N -- 4.3.7.2 Circular Retardation Plate -- 4.3.7.3 Linear Retardation Plate -- 4.3.7.4 Elliptical Retardation Plate -- 4.3.8 Jones Matrix of Twisted Fiber -- 4.4 Mueller Matrix Representation of Optical Devices -- 4.4.1 Definition of Mueller Matrix -- 4.4.2 Mueller Matrix of Optical Elements -- 4.4.2.1 Mueller Matrix of a Retarder with a Horizontal Fast‐Axis -- 4.4.2.2 Mueller Matrix of Rotator -- 4.4.2.3 Mueller Matrix of a Partial Polarizer -- 4.4.2.4 Mueller Matrix of Retardation Plate with Fast Axis at θ from the x‐Axis -- 4.4.2.5 Mueller Matrix of the Partial Polarizer with Fast Axis at θ from the x‐Axis -- 4.5 Polarization Evolution in Optical Fiber -- 4.5.1 Rotation Matrix Representation of the Unitary Optical System -- 4.5.2 Infinitesimal Rotation and Rotation Vector in Fiber -- 4.5.2.1 Infinitesimal Rotation and Rotation Vector -- 4.5.3 Birefringence Vector and Polarization Evolution Along with Fiber -- 4.5.3.1 Linear Birefringence -- 4.5.3.2 Circular Birefringence (Optical Activity) -- 4.5.3.3 Elliptical Birefringence (Optical Activity) -- 4.5.3.4 Elliptical Birefringence with Twist -- 4.5.4 PMD Vector and Polarization Evolution with Optical Frequency -- 4.5.4.1 Principal States of Polarization and PMD Vector -- 4.5.4.2 PMD Vector Concatenation Rules -- 4.6 Polarimetric Measurement of PMD -- 4.6.1 Poincaré Sphere Arc Method -- 4.6.2 Poincaré Sphere Analysis -- 4.6.3 Mueller Matrix Method -- 4.6.4 Jones Matrix Eigenanalysis -- 4.7 Polarization Properties of Quasi‐monochromatic Light -- 4.7.1 Analytic Signal Representation of Polychromatic Light -- 4.7.1.1 Quasi‐monochromatic Light. , 4.7.2 Coherency Matrix -- 4.7.2.1 Completely Unpolarized Light -- 4.7.2.2 Completely Polarized Light -- 4.7.2.3 Partially Polarized Light and Degree of Polarization -- 4.7.2.4 Coherency Matrix of the Superposition of Individual Waves -- 4.7.2.5 Superposition of Two Individual Waves with Mutually Orthogonal Polarizations -- 4.7.3 The Stokes Parameters of Quasi‐monochromatic Plane Wave -- 4.7.3.1 Completely Unpolarized Light -- 4.7.3.2 Completely Polarized Light -- 4.7.3.3 Partially Polarized Light -- 4.7.4 Depolarization of Polychromatic Plane Wave by Birefringence Media -- 4.7.4.1 Power Spectral Density -- 4.7.4.2 Polarization State of a Polychromatic Light After Passing Through a Birefringence Medium -- 4.7.4.3 Polychromatic Light with Rectangular Spectrum -- 4.7.4.4 Polychromatic Light with Gaussian or Lorentzian Spectrum -- References -- Further Reading -- Chapter 5 Polarization Properties of Common Anisotropic Media -- 5.1 Plane Waves in Anisotropic Media -- 5.1.1 Dielectric Tensor and Its Symmetry -- 5.1.2 Plane Wave Propagation in Anisotropic Media -- 5.1.2.1 Fresnel's Equation of Wave Normals -- 5.1.3 The Index Ellipsoid -- 5.2 Optical Properties of Anisotropic Crystals -- 5.2.1 Light Propagation in Uniaxial Crystals -- 5.2.1.1 Ordinary Ray -- 5.2.1.2 Extraordinary Ray -- 5.2.1.3 Optical Axis -- 5.2.2 Light Propagation in Biaxial Crystals -- 5.2.3 Double Refraction -- 5.2.4 Spatial Walk‐Off -- 5.2.5 Optical Activity -- 5.3 Electro‐optic Effect -- 5.3.1 General Description -- 5.3.2 Linear Electro‐optic Effect -- 5.3.2.1 Example: The Electro‐optic Effect in LiNbO3 -- 5.3.2.2 Case 1: Electric Field is Applied Along the z‐Axis -- 5.3.2.3 Case 2: Electric Field is Applied Along the x‐Axis -- 5.3.2.4 Case 3: Electric Field is Along the y‐Axis -- 5.4 The Photoelastic Effect in Isotropic Media. , 5.4.1 Birefringence and Strain‐Optical Tensor in Isotropic Material -- 5.4.2 Relationship Between Birefringence and Stress Tensor -- Reference -- Further Reading -- Chapter 6 Polarization Management Components and Devices -- 6.1 Polarization Management Fibers -- 6.1.1 Low Birefringence Fiber -- 6.1.2 Polarization Maintaining Fiber -- 6.1.3 Polarizing Fiber -- 6.1.4 Spun Fiber -- 6.2 Polarizers -- 6.2.1 Birefringence Crystal Polarizers -- 6.2.2 Sheet Polarizers -- 6.2.2.1 Film Polarizers -- 6.2.2.2 Glass Polarizers -- 6.2.3 Waveguide Polarizers -- 6.2.4 Other Types of Polarizers -- 6.3 Polarization Beam Splitters/Combiners -- 6.3.1 Birefringence Crystal PBS -- 6.3.1.1 PBS with Angular Separation -- 6.3.1.2 PBS with Lateral Separation -- 6.3.2 Thin Film Coating PBS -- 6.3.3 Fiber Pigtailed Polarizers and PBS -- 6.3.4 Waveguide PBS -- 6.4 Linear Birefringence Based Polarization Management Components -- 6.4.1 Wave Plates -- 6.4.2 Polarization Manipulation with a Quarter‐Wave Plate -- 6.4.2.1 Circular and Elliptical Polarizer -- 6.4.2.2 Anti‐reflection or Anti‐glare Film -- 6.4.3 Polarization Manipulation with a Half‐Wave Plate -- 6.5 Polarization Control with Linear Birefringence -- 6.5.1 Polarization Control with Multiple Wave Plates of Fixed Retardation but Variable Orientation -- 6.5.2 Polarization Controller with a Single Wave Plate of Variable Retardation and Orientation -- 6.5.3 Polarization Control with Multiple Wave Plates of Variable Retardation but Fixed Orientation -- 6.5.4 Polarization Controller with LiNbO3‐Based Integrated Optical Circuit (IOC) -- 6.5.5 Minimum‐Element Polarization Controllers -- 6.6 Polarization Control with Circular Birefringence -- 6.6.1 Magneto‐optic or Faraday Materials -- 6.6.2 Magneto‐optic Properties of Rare‐Earth Iron Garnet Films -- 6.6.2.1 Perpendicular Anisotropy Thick Films. , 6.6.2.2 Planar Anisotropy Thick Films.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4595-4599 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The resonance fluorescence of neutral hydrogen illuminated by Hα radiation has been used as a technique for the spatially and temporally resolved density measurements of neutral hydrogen in high temperature plasmas, such as in the tokamak and magnetic mirror plasma fusion devices. The fluorescence signal, usually very weak and buried in the background of stray laser light and Hα emission, is very difficult to extract and its measurements are inaccurate. This paper discusses the improvement of the signal extraction using two optical path laser-induced fluorescence (LIF) methods. One optical path carries the fluorescence signal and the background (the stray laser light and Hα emission), whereas the other path carries only the background signal. By combining these two signals, a clean fluorescence signal can be isolated by subtracting out the background using a differential amplifier. The measurement is obtained instantaneously from these two signals which are taken simultaneously in one pulse rather than being extracted from two separate spectra taken in two sequential pulses (double pulses). This method, therefore, makes a significant improvement on the double pulse technique in terms of the accuracy of the measurement and the time resolution. Using this LIF technique the measurement of the neutral density profile in the exhaust of a tandem mirror plasma propulsion device is obtained and presented. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 2119-2123 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The sheath potential φM is calculated from the difference between the plasma potential and the floating potential. The plasma potential has been measured by using a retarding field analyzer with an entrance slit located in front of it. The electron temperature Te and ion temperature Ti are also measured with the same analyzer in an electron cyclotron resonance plasma. Comparing the normalized sheath potential, −eφM/kTe, with the different theoretical values, it is found that the secondary electron emission could not be neglected in our experiment and is noncritical. The critical emission corresponds to zero electric field at the emitter. The various calculations have shown that the thermionic electron emission need not be required to be taken into consideration. The total energy transmission factors δT(=W/FTe, where W is the energy flux from the plasma, F is the ion flux, and Te is the electron temperature at the sheath edge) for hydrogen, nitrogen, and argon plasmas are calculated from the estimated secondary electron emission coefficient and the sheath potential, respectively. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pin-hole free ferroelectric (Pb,La)(Zr1−xTix)O3 thin films with uniform composition have been fabricated using the metallo-organic precursor compounds, which were carefully home synthesized. The structural development, spectroscopic, and dielectric properties of these films have been systematically investigated using atomic force microscopy (AFM), x-ray diffraction, Fourier transform infrared spectroscopy, Raman scattering, and dielectric measurements. It has been found from our experimental results of PZT 40/60 thin films that the overlapping of (h00) and (00l) peaks of these films in x-ray diffraction patterns, mainly due to the small grain sizes in films, makes it very difficult to distinguish individual diffraction peaks and to identify the phases. However, Raman measurements undoubtedly reveal the Raman spectra of these films in the tetragonal phase field, demonstrating that Raman spectroscopy is an effective tool to identify structures, especially in the case of thin films having very small grains. AFM results show that the PZT perovskite structure in films may grow radially by rosettes and that microcracks appear in the three-dimensional AFM pictures at grain boundaries, which may be the cause for easy dielectric breakdown.A striking feature of the AFM observation is that three polycrystalline perovskite regions intersect symmetrically at a point with 120° to each other, and a rosette growth model for the perovskite structure in PZT films is thus proposed to explain this new phenomenon. The excellent ferroelectric properties of these films, such as the high fatigue resistance and low leakage current, are attributed to the high quality of the metallo-organic solutions and to reduce the amount of oxygen vacancies in the films by optimizing the annealing conditions and by doping a suitable amount of La ions to minimize the charge blocking of oxygen vacancy at the interface by Pt electrode. It seems that the rhombohedral PZT films with softer hysteresis loops are suitable for nonvolatile random access memory application. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 6394-6397 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method is proposed according to which critical current density Jc at various temperatures T and dc fields B is estimated on (Tl0.5Pb0.5)(Ba0.2Sr0.8)2Ca2Cu3Oy based upon the flux diffusion barrier heights U(J,B,T) determined by means of ac susceptibility measurement at different ac field amplitudes, frequencies, T, and B. Jc is also estimated by the dc hysteresis measurement and compared with the former. The high Jc(B,T) and Tc show that this Tl-based superconductor is one of the more promising high-Tc materials from a practical standpoint. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 3287-3292 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic measurements have been performed on a GdBa2Cu3O6+x superconducting thin film. The paramagnetism carried by rare earth Gd3+ ions in the film tilts the magnetic hysteresis loop and broadens the width of the magnetic hysteresis ΔM, then the magnetization critical current density and the volume flux pinning force density based on the Bean critical state model deviate from intrinsic values. Therefore, in order to get useful information on the pinning mechanism, correction for the paramagnetism is essential. And after correction for the paramagnetism, a scaling law of the volume flux pinning force density is obtained as f(b)=(b/4)0.5(1−b/4)1.5, based on which the possible pinning mechanism in the film is discussed. In the end, deviation from the scaling law at high fields is interpreted by the collective pinning theory. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 2618-2624 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The analytical magnetization versus time expressions for several flux-pinning models for high-Tc superconductors are deduced. Magnetic relaxation and hysteresis studies have been performed on a zone-melted YBa2Cu3O6+x sample by SQUID. Nonlogarithmic magnetization decay is observed at relatively high temperatures; we attribute this to the nonlinear U(J) relationship which may arise from the local pinning potential Up(x), rather than collective pinning. At 70 K, the experimental data fits extremely well to the expression M(t)=M0+a(T)ln ln(t/τ) which is the result of the exponential U(J) relationship. Based on this U(J) law, the local pinning potential is determined to be Up(x)=U0(x/x0)[1−ln (x/x0)]. The voltage–current E(J) resulting from the observed U(J) relationship, as well as the role of the Y2BaCuO5 (211) phase in zone-melted YBCO is discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 1671-1675 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The time and field sweep rate dependencies of magnetization in high temperature superconductors are derived from a combined view based on the thermally activated flux creep. The τ0 in the magnetization relaxation expression M=M0+M1 ln(1+t/τ0) is a macroscopic quantity related primarily to the sample geometry and other experimental conditions via the effective activation energy U(J0). This activation energy provides an alternative interpretation to the nearly inverse proportionality of τ0 to the field sweep rate. The values of τ0 in the magnetization relaxation of single crystal YBa2Cu3O7−δ are consistent with the calculated ones. As the nonlinear U(J) is taken into account, the curvature in the ||M||-ln t plot may change from negative to positive over a sufficiently long time window, and the magnetization hysteresis M(H) depends on the field sweep rate H(overdot) by const+A ln H(overdot)+B ln2 H(overdot), where A is slightly larger than M1 and B(approximately-greater-than)0. A discussion of the temperature dependency of the normalized flux creep rate is at the conclusion of the article.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1723-1725 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: HgBa2Ca2Cu3O8+δ (Hg-1223) superconducting thin films of about 0.3 μm in thickness have been successfully synthesized. The process involves depositing films (∼ 1 μm thickness) of Ba2Ca2Cu3Ox on a SrTiO3 substrate by pulse laser ablation technique and implanting mercury ions into this deposited film, followed by annealing at oxygen atmosphere. The films so obtained show a relatively wide superconducting transition temperature up to 118 K, as determined magnetically, which is similar to that of underdoping bulk Hg-1223. © 1996 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 521-523 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate a new technique for displaying the electric field autocorrelation function of a laser pulse in real time, using two-beam coupling in a photorefractive crystal. This technique does not require phasematching, is simple to align, and can be used over the entire visible and near-infrared regions of the spectrum, even with weak laser beams.
    Type of Medium: Electronic Resource
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