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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We measure the per-carrier nonlinear responses caused by photoexcited carriers in two strained [111]-oriented InGaAs/GaAs multiple-quantum-well structures, and we compare them to that measured in a [100]-oriented structure. Without an external bias, we find that the absorption coefficient changes per photogenerated carrier for the [111]-oriented piezoelectric materials are smaller than for the [100]-oriented materials, not larger, as originally suggested. Subsequently, measurements of the per-carrier nonlinear responses as a function of reverse bias voltage demonstrate that the smaller per-carrier nonlinearities measured for the [111] structures are partially the result of a broadening of the excitons by the huge in-well fields, but can be primarily attributed to the quality of the [111]-grown materials. When corrected for differing in-well fields and for differing excitonic linewidths, the per-carrier responses are similar in magnitude, suggesting that the [111] response may eventually approach that of [100] material, but probably will not significantly exceed it. © 1996 American Institute of Physics.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7797-7804 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Local vibrational modes (LVM) of Si in substitutional sites have been observed by resonant Raman spectroscopy in highly doped (≥8×1018 cm−3) InxGa1−xAs layers, either relaxed or under strain, on [100] GaAs substrates. The peak frequency ωLVM of the Si on Ga site (SiGa) LVM in unstrained samples shifts to lower values with increasing In content. For x≤0.10 this shift is clearly higher than expected from a linear interpolation between the measured values in the binaries. The comparison between the SiGa peak frequency measured in both a full strained layer and a relaxed layer with similar composition provides a rough determination of the deformation potentials for the SiGaLVM in these layers: q/ω2LVM=−2.7±1 and p/ω2LVM=−2.5±1. As the In content becomes higher the width of the SiGa peak increases much more than that of the GaAs-like longitudinal optical-phonon peak, revealing the splitting due to the loss of local symmetry introduced by the In. New calibration factors for the Si-defect concentrations have been deduced, which allow estimation of the solubility limit for the Si incorporation in substitutional positions, which ranges from 2.3×1019 to 2.6×1019 cm−3 for the layers at the growth conditions used. The analysis of the integrated intensity of the LVM Raman peaks indicates that the degree of electrical compensation is clearly reduced for increasing In up to x≤0.05, due to both an increase of the solubility limit for Si in these layers and a saturation or slight reduction of the SiAs-related defect concentrations. This conclusion is also supported by Hall and plasmon measurements. © 1994 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4690-4695 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The incorporation of high concentrations ((approximately-greater-than)1019 cm−3) of Si, Be, and C in InxGa1−xAs relaxed layers has been studied as a function of In content (x≤0.16) by Raman spectroscopy of local vibrational modes (LVM). The frequencies of the Raman peaks resulting from the convolution of several split modes shift to lower values as the In content is increased, the carbon acceptor (CAs) local mode frequency showing the strongest dependency on x. Features attributed exclusively to the influence of In on second-neighbor sites are identified only in the Si-doped samples. The transverse and longitudinal modes expected from the splitting of a LVM of CAs with one In first neighbor are not observed in layers with x up to 0.085. A new calibration for the BeGa, CAs, and Si-related LVM leads to the conclusion that In increases the total electrical activation of Si and favors its incorporation on group-III sublattice sites. In contrast, no influence of In on the Be or C doping activation has been detected. The analysis of the CAs LVM spectra supports the view that in InxGa1−xAs CAs is preferably surrounded by Ga instead of In atoms for x≤0.085. © 1995 American Institute of Physics.
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By embedding piezoelectric InGaAs/GaAs multiple quantum wells (MQWs) in specifically designed p-i-n structures, we demonstrate that the nonlinear optical response can be used to identify the dominant screening mechanisms and simultaneously to determine the strain distribution. Furthermore, we show that a knowledge of the screening mechanisms and spatial band structure, in turn, can be used to control the nonlinear optical response. For this demonstration, we fabricate two p-i(MQW)-n samples on [111]-oriented GaAs substrates. The samples are designed such that, if the dominant screening is associated with photogenerated carriers that remain in the wells, a blue shift of the exciton would be expected in each. By contrast, if the screening is associated with carriers that have escaped the wells and moved to screen the entire MQW, one will shift to the blue and the other to the red if the lattice is mechanically clamped, but both will shift to the red if the lattice is mechanically free. The observation of a blue shift and a red shift indicates that, while in-well screening may be present, the dominant screening is out-of-well and that these particular structures are mechanically clamped to the lattice constant of the GaAs. Most importantly, these results illustrate the added flexibility that the piezoelectric field gives in tailoring the nonlinear optical response. © 1994 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3632-3634 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A comparison between compositionally stepped and alternating step-graded structures used in the production of a relaxation buffer layer is carried out by means of transmission electron microscopy. The latter shows higher efficiency in relieving the strain. A simple balance force model permits us to understand the reason for a higher generation of threading dislocations observed in the alternating step-graded structures. The presented results can be applied as new design rules for buffer fabrication that contrast in some key points with previous published rules as, for example, the "zero-net-strain'' precept [D. Dunstan, P. Kidd, P. F. Fewster, N. L. Andrew, L. González, Y. González, A. Sacedón, and F. González-Sanz, Appl. Phys. Lett. 65, 845 (1994)]. © 1995 American Institute of Physics.
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  • 6
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-resolution x-ray diffractometry has been applied to the structural characterization of piezoelectric strained InGaAs/GaAs multiquantum well p-i-n diodes grown by molecular beam epitaxy on (111)B GaAs substrates. Reference samples simultaneously grown on (001) GaAs have been also characterized. Diodes with 3, 7, and 10 periods and different well to barrier thickness ratio have been studied. Symmetric and asymmetric reflections at various azimuths were measured and the scans were fitted with theoretical curves obtained through a dynamical simulation program developed in our lab. The comparison between experimental and simulated profiles has enabled us to determine the main structural parameters of the samples. High-resolution x-ray diffractometry provided accurate data about period and capping layer thicknesses, indium content in the wells and state of relaxation, information which cannot be always obtained in (111)B samples from other characterization techniques such as photoluminescence or photocurrent spectroscopies. © 1996 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 950-952 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The contribution of the in-well screening of the piezoelectric field to the nonlinear optical response of a [111]-oriented strained InGaAs/GaAs multiple quantum well is separated from, and compared to, that associated with the out-of-well screening and with bleaching by using picosecond nondegenerate differential transmission techniques. These measurements demonstrate that the per-carrier nonlinearity associated with the in-well screening is smaller than that associated with the out-of-well screening by a factor roughly equal to the number of wells. © 1995 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 857-859 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have time-resolved the piezoelectric optical nonlinearities of a strained, [111]-oriented InGaAs/GaAs multiple quantum well p-i-n structure. By monitoring the temporal evolution of the excitonic absorption spectrum, we follow the photogenerated carriers as they drift to form the space-charge field responsible for screening the piezoelectric field. From the carrier dynamics, we can separate the contribution of in-well screening from that of the long-range screening associated with carriers that have escaped the wells. We have determined that in narrow quantum wells, in-well screening is smaller than long-range screening and that in-well screening is obscured by the concurrent onset of strong bleaching. © 1995 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 2223-2225 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The features present in the capacitance– and conductance–voltage characteristics of [100]- and [111]-oriented InGaAs/GaAs multi-quantum well (MQW) p-i-n structures under illumination are described. Sequential tunneling of electrons and holes is proposed to explain the different peaks observed, as they occur at voltages corresponding to resonant alignment of energy levels of adjacent wells. Two kinds of piezoelectric [111] devices are analyzed, with positive or negative average electric fields in the MQW region. The voltage corresponding to zero average electric field in the MQW is detected by a feature in the dark device capacitance. For the sample with negative average electric field, the capacitance characteristics clearly reflect the presence and evolution with voltage of a long range screening of the piezoelectric fields by the photogenerated carriers. © 1995 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 2042-2044 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of (111)B InxGa1−xAs/GaAs multiple quantum well p-i-n structures have been investigated via low temperature photocurrent and photoluminescence spectroscopies. The indium mole fraction was in the range of 0.07–0.23. Evolution of the experimental blueshifts of the transition energies, with the external bias, agreed very well with the theoretical calculations. This allowed us to obtain precise information about the piezoelectric constant, e14, for the various In compositions. For the range of x investigated, we have found e14(x) to be linear with x but significantly lower than predicted by a simple linear interpolation of the accepted values for GaAs and InAs. © 1994 American Institute of Physics.
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